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Model 4200-SCS Semiconductor Characterization System keithleyThe Keithley Test Environment Interactive (KTEI) V7.2 upgrade for the Model 4200-SCS Semiconductor Characterization System includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chassis. The test libraries included in KTEI V7.2 expand the Model 4200-SCS’s capabilities for solar cell I-V, C-V, and resistivity testing applications. The software upgrade also supports Drive-Level Capacitance Profiling (DLCP) to provide defect density information on thin-film solar cells.

Keithley
800-688-9951, www.keithley.com


For more information on KTEI V7.2 or any of Keithley’s other semiconductor test solutions, visit http://www.keithley.com/products/semiconductor/?mn=4200-SCS

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