Keithley Instruments, Inc. announces a C-V measurement instrument for its Model 4200-SCS Semiconductor Characterization System. The Model 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10 kHz to 10 MHz. This design provides built-in element models that eliminate the guesswork in obtaining valid C-V measurements. It includes an extensive set of test libraries, and increasing test efficiency.
Keithley Instruments, Inc.
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