Celadon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs. With one to 25 pins per site, the probe includes a standard 0.0125 mm diameter polished round tungsten rhenium probe tip (other tips available). The 2 cm diameter probe card mounts directly on a positioner for easy setup, eliminating the need for a rectangular probe card holder for many PCM test applications.
Celadon Systems, Inc.