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System Combines In-circuit and Boundary-scan Test
Digitaltest GmbH, and JTAG Technologies, announced the integration of their test methods within the Digitaltest MTS Series of in-circuit test systems, offering electronics designers and manufacturers greater test coverage and programmability of complex PCBs within a single process step. Digitaltest's Sigma 'combinational' test system includes comprehensive shorts/opens, analogue, power-up, serial bus (I2C CAN etc..), and 'vectorless', testing options. DSP based analog measurements allow shorts test of 1000 points per second. With integrated boundary-scan capabilities powered by JTAG Technologies, users can now further enhance their high-precision testing capabilities. Test development and deployment times are minimized, test coverage is maximized whilst fixture complexity can be reduced due to test-point elimination especially for complex digital PCBs where physical access [to electrical nodes] is limited. The JTAG Technologies boundary-scan option provides access to both test features and high throughput in-system programming (ISP) via the dedicated JT 3727/DPC, a four TAP IEEE 1149.x hardware controller developed in co-operation with Digitaltest.