Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. The seminar will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given. Participants will also have the opportunity to ask questions during the event.
Fundamentals of Ultra-Fast I-V Device Characterization is recommended for students, researchers, and engineers doing characterization of materials, processes, and devices; lab managers wanting to learn about this useful measurement technique; and engineers doing device and material reliability studies (for example, WLR, ESD, latchup, etc.).
The seminar will be presented by Lee Stauffer, a senior staff technologist for Keithley Instruments' Semiconductor Measurements Group in Cleveland, Ohio. Prior to joining Keithley, Stauffer's career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
Fundamentals of Ultra-Fast I-V Device Characterization will be broadcast on Thursday, April 29, 2010 at 15:00 CEST (9:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT for the North American audience. The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley's website for those unable to attend the original broadcast.
For More Information.
For more information on Keithley or any of its test solutions, visit www.keithley.com or contact the company at:
Telephone: 800-688-9951 / 440-248-0400
E-mail: publisher ( @ ) keithley dot com
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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