Mukherjee, Li, G. Peter Fang (Texas Instruments) and Rod Burt (Texas Instruments) were co-authors for the paper, “Automatic Stability Checking for Large, Linear Analog Integrated Circuits.” Their paper was the sole Best Paper Award winner and was selected from nine nominated candidates, 156 accepted technical papers and 690 submitted papers.
Stability analysis is one of the key challenges in the design of large linear analog circuits with complex multi-loop structures. In their paper, an efficient loop finder algorithm to identify potentially unstable loops in such circuits was presented. Their proposed technique outperforms existing stability methods by more than one order of magnitude for medium sized circuits and enables stability analysis of large extracted industrial designs which was previously infeasible.
Mukherjee is a Ph.D. student in the department under the advisement of Li. His research interests are in the area of VLSI CAD, in particular, circuit analysis, modeling and numerical algorithms.
Li has research interests in VLSI systems, CAD, parallel computing and computational neuroscience and biology. This is his third Best Paper Award from DAC.
DAC is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. In its 48th year, 2011 DAC featured a wide array of technical presentations, as well as more than 200 of the leading electronics design suppliers in a colorful, well-attended trade show that, literally, attracted stakeholders from around the world.