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Breakdown test demonstration on a high-power, High-voltage IGBT device

Wed, 04/04/2012 - 10:12am

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Here's a video showing how to perform a simple breakdown test on a high-power, high voltage IGBT device using Keithley's recently introduced Model 2657A SourceMeter instrument. The unit features a built-in high speed 6-1/2-digit measurement engine, enabling 1-fA current measurement resolution to support the low-leakage requirements of next-generation power semiconductor devices.

You can see the product introduction here.

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