Oscilloscopes add enhanced IBIS-AMI, S-parameters modeling support
Tektronix (Beaverton, OR) extended the capabilities of the analysis system on its MSO/DPO70000 Series of Digital and Mixed Signal Oscilloscopes to include modeling of on-chip silicon behavior using IBIS-AMI models and S-parameters. This improves correlation between measurement and simulation for faster, more accurate characterization of on-chip silicon behavior and performance for today's mobile, enterprise, and data communication standards. IBIS-AMI models are designed using the architecture of the actual receiver silicon. Support for IBIS-AMI is included as part of the Serial Data Link Analysis Visualizer (SDLA Visualizer) package that provides:
- A complete solution for de-embedding the effects of cables, fixtures and probes for silicon validation, system verification, backplane characterization, and embedded system performance.
- "What-if" channel analysis through simulating transmitter equalization and S-parameter scaling.
- Correlation with simulation results.
For more information, visit www.tektronix.com