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eBook explores testing DDR3 memory with boundary scan/JTAG

Tue, 08/06/2013 - 3:31pm

ASSET InterTech has issued a new eBook on how to test DDR memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory soldered to circuit boards is a major problem for system manufacturers.

“The ability to thoroughly test, characterize and diagnose problems with soldered-down memory is one of the most pressing problems in the industry,” said the author of the new eBook, Kent Zetterberg, product manager, ASSET InterTech. “Because DDR3 memory chips have become so prevalent in high-speed systems, I used this technology as the basis for explaining how JTAG or boundary-scan methods can be integrated into every step of a system’s life cycle, beginning in design and transitioning into manufacturing and field service.”

“Testing DDR3 Memory with Boundary Scan / JTAG” is available now on the ASSET web site at: http://www.asset-intertech.com/Products/Boundary-Scan-Test/BST-Software/Testing_DDR3_memory_Boundary_Scan-JTAG Other informative eBooks, white papers and videos on issues relating to chip, board and system debug, validation and test can be downloaded from: http://www.asset-intertech.com/News/White-Papers

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