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USB 3.0 test tools include a transmitter test solution for the SuperSpeedPlus 10 Gb/s specification

Tue, 06/25/2013 - 3:35pm

Superspeed testTektronix, Inc. announced a series of enhancements to its USB 3.0 test solutions including a transmitter test solution for the SuperSpeedPlus 10 Gb/s specification (option SSP). Other enhancements include a new USB 3.0 oscilloscope-based layered decode capability and an enhanced automated solution for SuperSpeed USB transmitter testing that is said to improve test throughput by up to 60 percent. Tektronix USB 3.0 decode software simplifies debug with protocol-specific triggering, easy to use search and navigation, and multi-layer decode. This allows the user to easily navigate through the protocol stack, fully time correlated with the analog waveform on the same screen. The TekExpress USB automation software (Opt USB-TX) incorporates a new software architecture that is said to provide significantly improved performance. According to the company, previously USB 3.0 Tx tests completed in 12 minutes, but now with the new TekExpress software testing completes in five minutes

Tektronix, Inc., www.tek.com

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