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Kit promises everything needed to fully evaluate high-speed data converters

Fri, 03/15/2013 - 10:55am

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high-speed data converter system evaluation kitTexas Instruments introduced what is said to be the industry's first complete high-speed data converter system evaluation kit (HSDC-SEK). The HSDC-SEK-10 includes a pattern capture card, pattern generator card, low-jitter clock source, clean 10-MHz signal source and a multi-output regulated power supply. According to the company, the HSCD-SEK-10 can significantly reduce evaluation time and costs for a host of demanding applications in which high-speed data converters, such as the dual, 14-bit, 250-MSPS ADS4249 analog-to-digital converter (ADC) and the quad, 16-bit, 1.5-GSPS DAC34SH84 digital-to-analog converter (DAC), are key system performance drivers. Examples include test and measurement, communications, defense and medical equipment. Features include the TSW4806EVM, which offers the LMK04806 dual-PLL clock jitter cleaner and generator and provides a complete, low-cost, low-noise and portable clocking solution; TSW1405EVM pattern capture card, which supports most LVDS-format TI ADC evaluation modules EVMs) with a capture buffer of 64K samples; TSW1406EVM pattern generator card, which supports pattern generation for most LVDS-format TI DAC EVMs, with a pattern size of up to 64K samples; TSW2200EVM, which supplies low-noise power to EVMs, and the TSW2110EVM, which provides a clean 10-MHz analog input for the ADC; and fast FFT analysis or pattern generation: High-Speed Data Converter Pro graphical user interface (GUI) enables speedy FFT analysis or pattern generation capabilities.

Texas Instruments, www.ti.com

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