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Multi-lead Probe for PCIe 3.0 Supports 8 GT-s Data Rates at Widths Up to x16 Lanes

Mon, 01/30/2012 - 5:11am

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multi-lead probeLeCroy Corporation announced a new multi-lead probe for the Summit T3-16 and Summit T3-8 Protocol Analyzers, supporting the PCI Express 3.0 specification (which includes data rates up to 8 GT/s). Adding the multi-lead probes to the company’s probe collection provides an essential accessory for debugging hard-to-access PCI Express systems and buses. Multi-lead probes are desirable to probe point-to-point bus signals (e.g., for serial data buses that run between chips on a single circuit board), or for probing serial buses when there is no supported interposer card. The probe is expandable to support from x1 to x16 PCI Express lanes when using a Summit protocol analyzer. Probe tips are flexible for tapping signals in narrow areas on circuit boards. The probe head uses the company’s new Gen3 tapping technology which increases signal integrity and offers precision signal tapping for 8GT/s. All LeCroy protocol analyzers feature a hierarchical display, real-time statistics, protocol traffic summaries, detailed error reports, powerful scripting, and the ability to create user-defined test reports, which in combination provide an exceptional analysis system to allow developers to troubleshoot intricate problems and to finish their projects on time.

LeCroy Corporation
800- 453-2769, www.lecroy.com
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