Applications Test Solution Focused on Multi-mode LTE Devices
MD8475A Supports Testing for a Wide Range of Applications from SMS/MMS to High-Speed Video Streaming and Battery Performance Test.
Anritsu is proud to announce the planned introduction of the MD8475A Signaling Tester, with capability to test a wide range of applications on the latest high-speed, multi-mode LTE devices. The MD8475A broadens Anritsu’s market-leading 2G/3G and LTE portfolio to include the widest available range of solutions, ranging from R&D to Applications Test, Conformance Test, Operator Acceptance, and Manufacturing.
The MD8475A Signaling Tester was designed by Anritsu to enable testing of applications for the newest 4G/LTE networks, and builds on existing 2G/3G capability offered by the MD8470A Applications Tester. The popular Wireless Network Simulator (WNS) graphical user interface, originally available in the MD8470A, has been enhanced in the MD8475A to include multi-mode, dual-cell capability, including handovers from 2G/3G to 4G/LTE. Since the MD8475A is a Windows-based instrument, server applications can be conveniently installed into the MD8475A to allow for easy application testing with a single-instrument solution, or external servers can be connected through Ethernet connections.
“Testing of applications on the newest high-speed LTE devices and networks will be critical to ensure consumer satisfaction with device performance and battery life,” said Wade Hulon, Vice President and General Manager of Anritsu Company. “The introduction of the MD8475A Signaling Tester enables easy testing of these applications, and continues our historical support for the application test market with addition of new high-speed 4G/LTE support and multimode capability. We look forward to supporting the accelerating global rollout of LTE devices and networks through 2011 and beyond.”
The MD8475A is a multi-format signaling tester, with capability to test multi-mode wireless devices, including GSM/GPRS/E-GPRS, 1xRTT, 1xEV-DO, W-CDMA/HSPA, TD-SCDMA, and FDD-LTE. The highest speed commercially available (Category 3) LTE devices can be tested with the MD8475A, with downlink IP-layer throughput to 100 MB/s (including 2x2 MIMO) and uplink throughput to 50 MB/s. The MD8475A enables testing of many types of mobile device applications ranging from traditional SMS/MMS, browsing, and streaming, to advanced applications, such as augmented reality and real-time multi-player gaming. Since high data rate applications have the potential to drain an LTE device’s battery very quickly, the MD8475A enables easy testing on the affect of these applications on a device’s battery performance.
To learn more visit www.anritsu.com.