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Digital Radio Frequency V4 Test Solution Includes Simultaneous Stimulus and Analysis

Thu, 03/03/2011 - 7:20am
Agilent Technologies Inc. announced what it asserts is the industry’s first digital radio frequency (DigRF) V4 test solution with dual-capture capability. This software enhancement gives engineers the ability to simultaneously apply a stimulus to devices under test and analyze the results with a single instrument, the Agilent N5343A DigRF V4 exerciser. The new exerciser allows developers of radio-frequency integrated circuits (RF-ICs) and baseband integrated circuits (BB-ICs) as well as integrators of wireless handsets to characterize their devices using fewer probes. The N5343A DigRF V3/V4 exerciser allows engineers to work in the domain (digital or RF) and abstraction level (physical or protocol layer) of their choice to quickly characterize RF-ICs and rapidly solve cross-domain integration problems. The company’s dual-capture technology is positioned to eliminate the need for an analyzer to monitor transmit and receive packets for this application. Dual capture enables up to 512 Mb generate memory, up to 512 Mb capture memory or a programmable option to distribute 512 Mb capture memory within the stated ranges. The Agilent N5345A and N5346A active probing solutions with ultralow capacitive loading (<0.15 pF) and high sensitivity provide system insight with minimum disturbance at the gigabit speeds used in DigRF V4 testing

Agilent Technologies
877-424-4536, www.agilent.com 
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