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Modular Test Platform Aids LTE Measurement

Fri, 09/18/2009 - 5:44am

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the modular PXI 3000 test platform from Aeroflex Enabling production test engineers to achieve faster time to volume for RF components and LTE user equipment, the modular PXI 3000 test platform from Aeroflex now has Long Term Evolution (LTE) measurement capabilities. The measurement suite is complemented by the LTE waveform generation capabilities of IQCreator software, which supports the PXI 3000 Series as well as the Aeroflex 3410 Series of bench-top digital RF signal generators.

Aeroflex
800-853-2352, www.aeroflex.com

 

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