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In-Circuit Test System Provides Both Analog and Digital Capability

Tue, 04/21/2009 - 11:00am

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Medalist i1000D in-circuit test system agilentBridging the gap between high-functionality in-circuit testers and low-end manufacturing defects analyzers, the Medalist i1000D in-circuit test system from Agilent Technologies offers both analog and digital test capability. Features include a graphical user interface, per-pin programmability, digital PCF/VCL library-based testing, native boundary-scan capabilities, and I2C/SPI serial programming. The system comes with full native boundary scan test capabilities and VTEP v2.0 Powered vectorless test suite with Cover-Extend technology.

Agilent Technologies
www.agilent.com

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