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Open Access Test Chassis

Tue, 02/19/2008 - 5:38am

Elma Electronic Inc. announced an open frame chassis for test/debugging. The unit does not have side or back walls around the card cage area, leaving it open for easy access. The E-frameElma Electronic Inc. announced an open frame chassis for test/debugging.  The unit does not have side or back walls around the card cage area, leaving it open for easy access. The E-frame was designed with the high (and flexible) power and cooling requirements for VPX (VITA 46/48) systems, any 3U or 6U backplanes can be used. This includes VME/64x, VXS, CompactPCI, and other backplane architectures. The Type 39E Portable Tower has a convenient carrying handle. With a rugged modular aluminum construction, the chassis can support up to 21 slots at .8" or 17 slots at 1" pitch.  There are front accessible test points and monitoring LEDs for all VME, VPX, VXS, and cPCI voltages. This includes +3.3V,  ±5V, ±12V, ±24V, and ±48V DC. It features high performance cooling with 3 x 150 CFM fans under the card cage. The fans are speed controlled with fan fail indication.  A system monitor with remote monitoring via Ethernet capability is optional. The black-coated powder coated finish of the E-frame enhances aesthetics.  Other features include a Rear A/C PEM (Power Entry Module) with fuses, GND Stud, Front located ESD jacks. The unit also offers full RTM (rear transition module) support.

Elma Electronic
510-656-3400, www.elma.com

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