Advertisement
Product Releases
Advertisement

Meter for Semiconductor Parametric Analysis and Testing

Wed, 10/31/2007 - 7:42am

LISTED UNDER:

ec7ntm803a-LKeithley Instruments, Inc. announced its models 2635 and 2636 SourceMeter instruments that do parametric analysis at resolutions of 1fa (10A to 15A) which is required for many semiconductor, optoelectronic and nanotechnology devices. With their Test Script Processor (TSP) and TSP-Link intercommunications bus, these instruments enable engineers to create fast test systems that are suitable for research, characterization, wafer sort, reliability and production monitoring. Both models provide DC and pulse testing from femtoamps and microvolts up to 200V/1.5A. They operate with or without a PC, and each includes a PC-like microprocessor to enable easy programming and independent execution of test programs (scripts) ranging from the simple to complex, including sourcing, measuring, test sequence flow control, and decisions with conditional program branching.

Keithley Instruments, Inc., 800-688-9951, www.keithley.com 

 

Advertisement

Share this Story

X
You may login with either your assigned username or your e-mail address.
The password field is case sensitive.
Loading