Cascade Microtech announces its WinCal XE calibration software to help semiconductor labs create more accurate high-frequency RF device models. The 16-term calibration eliminates certain undesired measurement parasitic effects, thus enabling more accurate device models and shorter design cycle times. Its flexible design and open architecture allow innovations and capabilities to be added quickly to the software. High frequency transistor measurement begins by calibrating the test system to the wafer probe tips using known test standards. Next, to eliminate undesired parasitic effects of transistor probing pads, wafer dummy pad structures are measured, de-embedding their loading and crosstalk effects on the intrinsic transistor.
Cascade Microtech, Inc.