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RFI/EMI

IC scanner and micro near field probes up to 60 µm resolution

April 14, 2015 1:06 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The ICS 105 IC scanner can be used together with the ICR near-field microprobes to measure high-frequency near fields above integrated circuits (ICS 105 GND set) and small modules (ICS 105 UH set). The analysis of an IC's near fields provides a better understanding of what happens inside the IC at high frequencies. The measurements ...

LISTED UNDER: Probes | Frequency | IC

Magnetic field source generates EFT/burst fields

March 10, 2015 1:51 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an HV cable. The field source generates high magnetic fields (approx. 200 mT) in very small spaces (2.54 mm²). It is thus ideal ...

LISTED UNDER: Probes | IC | RFI/EMI
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