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IC

IC scanner and micro near field probes up to 60 µm resolution

April 14, 2015 1:06 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The ICS 105 IC scanner can be used together with the ICR near-field microprobes to measure high-frequency near fields above integrated circuits (ICS 105 GND set) and small modules (ICS 105 UH set). The analysis of an IC's near fields provides a better understanding of what happens inside the IC at high frequencies. The measurements ...

LISTED UNDER: Probes | Frequency | IC

Magnetic field source generates EFT/burst fields

March 10, 2015 1:51 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an HV cable. The field source generates high magnetic fields (approx. 200 mT) in very small spaces (2.54 mm²). It is thus ideal ...

LISTED UNDER: Probes | IC | RFI/EMI

Control software offers high gains in speed and productivity

February 2, 2015 3:36 pm | by Cascade Microtech | Cascade Microtech | Product Releases | Comments

Cascade Microtech has evolved its probe station user environment to an unprecedented level of power and efficiency with the latest release of Velox. The company has consolidated its Nucleus and ProberBench system software packages into a universal ...

LISTED UNDER: Test Instrumentation | High Frequency | RF/Microwave
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‘Battery fuel gauge’ integrated circuits reduce measurement errors to below ± 2.8 percent

March 4, 2014 12:35 pm | On Semiconductor | Product Releases | Comments

ON Semiconductor (Phoenix, AZ) has introduced a new family of complementary metal-oxide semiconductor (CMOS) ‘battery fuel gauge’ integrated circuits that provide accurate measurements of the remaining power level of one-cell lithium-ion (Li+) batteries commonly used in a wide range of portable electronics....

LISTED UNDER: Battery | IC

Source measure unit instrument includes capacitive touchscreen, targets engineers and non-engineers

August 14, 2013 9:51 am | Keithley Instruments | Product Releases | Comments

Keithley Instruments announced what it asserts is the first benchtop source measure unit (SMU) instrument with a capacitive touchscreen graphical user interface. The Model 2450 SourceMeter SMU combines the intuitive touchscreen and icon-based control that novice SMU users can

LISTED UNDER: Meters | Current Meters | IC

Universal PLD test system can perform boundary scan IC and board tests

April 30, 2013 12:27 pm | Saelig Company, Inc. | Product Releases | Comments

Saelig Company has introduced the JTAGMaster Tester/Programmer, an integrated solution for testing and configuring Programmable Logic Devices (PLDs). JTAGMaster can perform boundary scan IC and board tests, as well as programming JTAG-compatible IC and EEPROMs using external adapters.

LISTED UNDER: IC
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