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Test & Measurement

Test instrument features operational frequency range of 100 Hz to 100 kHz

April 27, 2015 1:10 pm | by Global Specialties | Global Specialties | Product Releases | Comments

The LCR-600 is a high-precision test instrument used for measuring the inductance (L), capacitance (C), and resistance (R) of an electrical component. The LCR-600 has an operational frequency range of 100 Hz to 100 kHz and a basic measurement accuracy of 0.3%. There is a dual LCD display, measurement voltage fixed at 0.6 V ...

LISTED UNDER: Meters

Dual-channel TDR locates faults on all metallic cables

April 23, 2015 12:57 pm | by Megger | Product Releases | Comments

Megger now offers the TDR2010, a dual channel, high resolution time domain reflectometer (TDR) for locating faults on all metallic cables, including twisted pair wires and coax cables. This new TDR features a large (800 x 400 pixels), extra high-resolution (to 0.1 m), backlit, WVGA color LCD display with user definable tones.

LISTED UNDER: Electrical

Controllers offer unparalleled J1939/NMEA2000 connectivity

April 16, 2015 11:46 am | by Divelbiss Corporation | Divelbiss Corporation | Product Releases | Comments

Divelbiss Corporation announces significant upgrades to their P-Series PLC on a Chip based controllers integrating enhanced J1939 / NMEA2000 connectivity options and SD Card data logging. By supporting user configurable messaging, users will now have the freedom to fully implement these communication buses....

LISTED UNDER: Microcomputer | Computer | Electromechanical
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8.5 GHz auto calibration unit ideal for manufacturing and test facilities

April 14, 2015 1:48 pm | by Anritsu Company | Anritsu Company | Product Releases | Comments

Anritsu Company introduces the MN25208A SmartCal two-port 8.5 GHz auto calibration unit for its ShockLine family of vector network analyzers (VNAs). A plug-and-play calibration unit, SmartCal automatically powers on via a USB connection and loads calibration coefficients from on-board memory, for faster ...

LISTED UNDER: Electrical

IC scanner and micro near field probes up to 60 µm resolution

April 14, 2015 1:06 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The ICS 105 IC scanner can be used together with the ICR near-field microprobes to measure high-frequency near fields above integrated circuits (ICS 105 GND set) and small modules (ICS 105 UH set). The analysis of an IC's near fields provides a better understanding of what happens inside the IC at high frequencies. The measurements ...

LISTED UNDER: Probes | Frequency | IC

Pressure transmitters and switches designed for hazardous environments

April 9, 2015 12:30 pm | by Gems Sensors & Controls | Gems Sensors & Controls | Product Releases | Comments

Gems Sensors & Controls (Gems) has announced the global market launch of its Model 3800/3820 Series. The new Gems Model 3800/3820 Series is a family of reliable, accurate, compact OEM pressure transmitters and switches for hazardous area and other hostile environments. The new Model 3800 Series pressure transmitter ...

LISTED UNDER: Meters

Oscilloscope preserves signal-to-noise ratio for higher fidelity

April 9, 2015 12:09 pm | by Tektronix | Tektronix | Product Releases | Comments

Key innovations delivered in the DPO70000SX ATI Performance Oscilloscope that set it apart from traditional ultra-high bandwidth oscilloscopes include world’s first 70 GHz real-time oscilloscope with Tektronix’ patented Asynchronous Time Interleaving (ATI) technology that preserves signal-to-noise ratio for higher fidelity....

LISTED UNDER: Test & Measurement | Probes | Oscilloscope

Vector signal generators ideal for applications in product design, testing, and manufacturing

March 31, 2015 9:16 am | by Newark | Newark | Product Releases | Comments

The TSG4100A series of vector signal generators (VSG) from Tektronix is ideal for applications in product design, testing and manufacturing. The TSG4100 combines an RF signal generator and a vector signal generator (VSC) to meet increasing demands for more affordable test solutions in ...

LISTED UNDER: Signal Generator
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Current probe boosts immunity to local dV/dt transients

March 31, 2015 7:44 am | by Power Electronic Measurements Ltd | Product Releases | Comments

To meet the demands of measuring transient currents in semiconductors using new technology, such as SiC and GaN, Power Electronic Measurements Ltd (PEM) has designed the CWT MiniHF Rogowski current probe. Combining a novel shielding technique, utilising a low sensitivity coil and patented low-noise signal-conditioning circuitry ...

LISTED UNDER: Test & Measurement | Probes

Vector Network Analyzers offer sweeps at 100 microseconds per point

March 26, 2015 8:41 am | by Anritsu Company | Anritsu Company | Product Releases | Comments

Anritsu Company introduces the ShockLine MS46121A series of 1-port USB Vector Network Analyzers (VNAs) that bring the price, performance, and ease-of-use advantages of Anritsu’s patented ShockLine VNA technology to an extremely compact package. Two models with frequency coverage ...

LISTED UNDER: Digital

CSB1470 USB controlled Digital Input Output (DIO) Module

March 16, 2015 4:52 pm | J-Works, Inc. | Products

USB controlled DIO modules that support multiple voltage levels. 24 or 48 digital IO channels support interface voltage levels of 1.8V, 2.5V, 3.3V and 5V. Each channel can be configured as digital input or output.

LISTED UNDER: Computer | Data Acquisition | Embedded

Test kit measures cable length and generates tone levels

March 10, 2015 4:01 pm | by Platinum Tools | Platinum Tools | Product Releases | Comments

Platinum Tools is proud to announce that it will debut the Net Prowler Pro Test Kit during 2015 ISC West, held in Las Vegas, Nev. from April 15-17 at the Sands Expo and Convention Center, booth #5036. The Net Prowler Pro Test Kit (P/NTNP850K1) is now shipping with an MSRP of $999.95. A tester-only kit ...

LISTED UNDER: Signal Generator

Magnetic field source generates EFT/burst fields

March 10, 2015 1:51 pm | by Langer EMV-Technik GmbH | Product Releases | Comments

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an HV cable. The field source generates high magnetic fields (approx. 200 mT) in very small spaces (2.54 mm²). It is thus ideal ...

LISTED UNDER: Probes | IC | RFI/EMI

CableEye® M3U Cable Tester System: Item 821U

March 3, 2015 5:00 pm | CAMI Research, Inc. | Products

For diagnostic and Pass/Fail Testing — Find, display, log, document: opens, shorts, miswires, intermittent connections, continuity, contact and isolation resistance, embedded resistors and diodes. • 152 Test point base unit (for ≤76-conductor cable) • Expandable to 2560 test points (for >76-conductor cable) • Resistance measurement 0.3Ω-10MΩ • Graphical User Interface (GUI) • 9x12" bench footprint
 ◊ Includes: CB15 board set (Item 745), PC s/w, DB of >200 standard cables, 1yr warranty, 1yr free tech support, one-year free software and database upgrades. USB interface standard. ◊ If cables will never exceed 64 conductors, the M2-Basic system (Item 810) offers similar capabilities without resistance measurement at a lower cost.

LISTED UNDER: Schematic Capture | Data Acquisition | Data Loggers

Light Director™ Guided Assembly System: A CableEye® Accessory

March 3, 2015 4:56 pm | CAMI Research, Inc. | Products

For assembling connectors used in aerospace, medical, and other high-reliability applications. Light fibers driven by super-bright LED lamps individually illuminate target cavities in the connector being assembled.
 • Light-Directed guided assembly • 1st-Sided Pinning and 2nd-Sided Pinning with electrical test • Increases productivity by up to 50% over manual assembly • Reduces technician fatigue • Reduces errors to near zero ◊ The Light Director™ system is an accessory for the CableEye® PC-Based cable test system. It requires a reusable mounting kit for each mating connector (see Items CB37A to CB38A), and the AutoBuild Guided Assembly Software (Item 728).

LISTED UNDER: Schematic Capture | Test Instrumentation | Data Loggers

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