Power Meter for Start-Up of ATE Systems
August 3, 2007 7:50 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies, Inc. introduces its N8262A P-Series LXI-compliant power meter. This compact power meter is 1U high, and it supports LAN-based automated measurements of peak, peak-to-average ratio and average power. Its small size and ability to operate without shared power supplies, cardcages or system controllers enables a lower start-up cost for an automated test system.
LISTED UNDER: Test & MeasurementProbe Cards for Low Leakage Measurements
August 3, 2007 6:58 am | Product Releases | CommentsCeladon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs.
LISTED UNDER: Test & MeasurementRecording of Real-Time Data and Events
August 3, 2007 6:52 am | Product Releases | CommentsReal-Time Innovations (RTI) announces its RTI Recorder, a software system for logging the high-throughput data, events and messages that drive the behavior of distributed real-time applications. The recorded activity can be used for future analysis and debugging, regulatory compliance and replay for testing and simulation purposes.
LISTED UNDER: Test & MeasurementJitter Test System
August 3, 2007 6:37 am | Product Releases | CommentsThe Wireless Telecom Group Co. announces its Noise Com J7000 jitter test system that alters serial signal streams through injection of Gaussian noise in a way that reflects real world signal behavior. To evaluate performance of components and systems, it is capable of adding specific amounts of white noise to the signal stream that allows the measurement of signal-to-noise ratio (SNR), carrier-to-noise ratio (CNR) and bit-error-rate (BER).
LISTED UNDER: Test & MeasurementFour-channel Piezoelectric Sensor Signal Conditioner
August 3, 2007 6:28 am | Product Releases | CommentsPCB Piezotronics introduced Model 482C54, a compact benchtop signal conditioner for ICP, IEPE and charge output piezoelectric sensors. The signal conditioner is compatible with accelerometers, microphones, pressure transducers, force sensors and strain sensors. It can accept a direct voltage input signal, allowing it to be used with most voltage sensor signals.
LISTED UNDER: Test & MeasurementNAND/NOR Flash Programming System
August 2, 2007 7:04 am | Product Releases | CommentsBPM Microsystem’s Flashstream offers flash programming of NAND and NOR flash memory at speeds as low as 2.5 percent over the theoretical programming minimum. The company’s Vector Engine uses a proprietary co-processor design to hardware accelerate flash memory waveforms during the programming cycle. Faster speeds are achieved through synchronous operations that eliminate the dead times when the DUT waits on the programmer. The result is
LISTED UNDER: Test & MeasurementDual-Purpose 8 Gb/s Fibre Channel SAN Tester and Protocol Analyzer
July 30, 2007 11:20 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies Inc. introduced what is said to be the industry's only dual-purpose SAN tester and protocol analyzer for 8 Gb/s Fibre Channel (FC). Combining realistic network stimulus of the SAN tester application with sophisticated protocol analysis and troubleshooting capabilities allows engineers to speed up the design and development of next-generation storage devices. The module helps storage equipment manufactures conduct realistic tests on their device under test (DUT) early in the development and qualification cycle
LISTED UNDER: Test & MeasurementTime-to-Digital Converter for Timing-Measurement Applications
July 25, 2007 10:30 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies introduced the first time-to-digital converter (TDC) from its Acqiris product line, featuring six independent stopwatches for precise timing measurements from a common start event to multiple stop events at a high resolution. The TC890 is appropriate for time measurement applications, including laser detection and ranging (LIDAR) for 3D mapping and navigation, fluorescence lifetime spectrometry, and ion counting in time-of-flight mass spectrometry (TOFMS). Many pulse-timing measurements, such as period, frequency and time interval analysis (TIA), are suitable for the TDC's precise measurement technology.
LISTED UNDER: Test & MeasurementVisual Fault Locator in Rugged Pen Design
July 23, 2007 7:14 am | Product Releases | CommentsTyco Electronics hand held Visual Fault Locator is a rugged and affordable solution for identifying breaks and bending in optical fibers and cabling. Its red 650nm laser glows at the location of faults, in either continuous or pulsed modes. An AA-size battery provides 30 hours of continuous use and a soft-side protective case with belt loop is included, along with a lanyard dust cover.
LISTED UNDER: Test & MeasurementSampling Oscilloscope Probes Second Generation PCI Express, Serial ATA, XAUI and 10 Gigabit Ethernet
July 10, 2007 12:49 pm | Product Releases | CommentsLeCroy Corporation introduces WaveExpert 100H, said to be the first sampling oscilloscope capable of acquiring, measuring and processing signals that cannot be physically probed. It addresses the analysis and compliance requirements of the long serial data patterns required by standards such as second generation PCI Express, serial ATA, XAUI and 10 Gigabit Ethernet. The modular architecture supports up to four optical or electrical channels with bandwidths up to 100 GHz, as well as
LISTED UNDER: Test & MeasurementHigh-Flow Temperature Forcing System
July 10, 2007 12:28 pm | Product Releases | CommentsThermonics, Inc. announces the T-2500HFE precision temperature forcing system (PTFS) that provides increased air flow to control temperatures of high power electronic components and parallel component testing. The system controls device temperatures with power consumption of up to 140W to within ±1°C.
LISTED UNDER: Test & MeasurementDigital Power Meters
July 10, 2007 12:22 pm | Product Releases | CommentsChroma ATE, Inc. announces its series 66200 digital power meter that is designed for accurate AC power measurements. The internal 16-bit analog/digital converters provide high speed sampling rates up to 240 KHz. In addition to standard power measurements, these power meters include inrush current, total harmonic Distortion of V/I and energy measurements.
LISTED UNDER: Test & MeasurementTemperature Meter with Audible Buzzer
July 10, 2007 12:18 pm | Product Releases | CommentsOmega Engineering introduces its DP7000 temperature meter that offers a wide temperature range, two selectable alarm settings and an internal buzzer that indicates alarm condition or error. The user can define set-point, ON/OFF heating/cooling regulation, alarm configuration, load status and ambient probe adjustment.
LISTED UNDER: Test & MeasurementCalibration Software Enhances RF Device Accuracy
July 10, 2007 12:12 pm | Product Releases | CommentsCascade Microtech announces its WinCal XE calibration software to help semiconductor labs create more accurate high-frequency RF device models. The 16-term calibration eliminates certain undesired measurement parasitic effects, thus enabling more accurate device models and shorter design cycle times. Its flexible design and open architecture allow innovations and capabilities to be added quickly to the software.
LISTED UNDER: Test & MeasurementData Acquisition Box for Harsh Applications
July 10, 2007 12:05 pm | Product Releases | CommentsHacker-DatenTechnik announces its MF16080-T series of small portable USB data acquisition boxes with an extended temperature range of -40°C to +105°C that are usable for a range of industrial, offshore and military applications. For OEM applications the inside PCB is also available separately with an extended temperature range of -40°C to +120°C.
LISTED UNDER: Test & Measurement
