2.4X Spectrum Analyzer
August 3, 2007 10:59 am | Product Releases | CommentsMetaGeek announces its Wi-Spy 2.4X spectrum analyzer for resolving interference issues. With higher frequency resolution, amplitude resolution and amplitude range than previous models, it is easier to identify wireless signals that could be causing interference with Wi-Fi networks. Chanalyzer 2.1 software provides improved graphics, powerful play-thru controls and a user-friendly interface.
LISTED UNDER: Test & MeasurementSoftware for HDMI Compliance Test
August 3, 2007 10:55 am | Tektronix | Product Releases | CommentsTektronix, Inc. announces its TDSHT3 software that has been upgraded to support the HDMI compliance test specification version 1.3b. It is an HDMI compliance test software resident on a proprietary oscilloscope that controls the signal generators in a closed loop mechanism to automatically perform complex cable and sink tests.
LISTED UNDER: Test & MeasurementData Logger for CAN and ARINC-429 Bus
August 3, 2007 10:49 am | Product Releases | CommentsUnited Electronic Industries announces its UEILogger series that can log CAN and ARINC-429 bus data as well as RS-232, 422 and 485 ports. This functionality, combined with the logger’s small size and ruggedness (50g shock, -40°C to +85°C, 0 to 70,000 feet) makes it suitable for in-vehicle testing in the aerospace, aircraft, automotive, marine and rail transportation industries.
LISTED UNDER: Test & MeasurementHigh Speed Digitizers
August 3, 2007 10:44 am | Product Releases | CommentsGaGe announces its Cobra family of 8-bit high-speed digitizers. The digitizers are available with one or two digitizing channels, sampling speeds of up to 2 GS/s and up to 1 GHz input bandwidth. With up to 4 GS of on-board acquisition memory per card, they are suitable acquiring either large amounts of data simultaneously over long periods of time, or an extreme number of short data bursts.
LISTED UNDER: Test & MeasurementAngular Rate and Acceleration Measurement
August 3, 2007 10:34 am | Product Releases | CommentsSystron Donner Automotive Div. introduces its Inertial Measurement Unit (IMU) that can simultaneously detect both angular-rate and acceleration along multiple axes. Packaged in a rugged housing, the device includes solid-state MEMS gyroscopes, accelerometers, a CAN interface, power conditioning and a microcontroller, all configured to meet the sensing and packaging requirements of any OEM or Tier 1 supplier.
LISTED UNDER: Test & MeasurementPower Meter for Start-Up of ATE Systems
August 3, 2007 7:50 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies, Inc. introduces its N8262A P-Series LXI-compliant power meter. This compact power meter is 1U high, and it supports LAN-based automated measurements of peak, peak-to-average ratio and average power. Its small size and ability to operate without shared power supplies, cardcages or system controllers enables a lower start-up cost for an automated test system.
LISTED UNDER: Test & MeasurementProbe Cards for Low Leakage Measurements
August 3, 2007 6:58 am | Product Releases | CommentsCeladon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs.
LISTED UNDER: Test & MeasurementRecording of Real-Time Data and Events
August 3, 2007 6:52 am | Product Releases | CommentsReal-Time Innovations (RTI) announces its RTI Recorder, a software system for logging the high-throughput data, events and messages that drive the behavior of distributed real-time applications. The recorded activity can be used for future analysis and debugging, regulatory compliance and replay for testing and simulation purposes.
LISTED UNDER: Test & MeasurementJitter Test System
August 3, 2007 6:37 am | Product Releases | CommentsThe Wireless Telecom Group Co. announces its Noise Com J7000 jitter test system that alters serial signal streams through injection of Gaussian noise in a way that reflects real world signal behavior. To evaluate performance of components and systems, it is capable of adding specific amounts of white noise to the signal stream that allows the measurement of signal-to-noise ratio (SNR), carrier-to-noise ratio (CNR) and bit-error-rate (BER).
LISTED UNDER: Test & MeasurementFour-channel Piezoelectric Sensor Signal Conditioner
August 3, 2007 6:28 am | Product Releases | CommentsPCB Piezotronics introduced Model 482C54, a compact benchtop signal conditioner for ICP, IEPE and charge output piezoelectric sensors. The signal conditioner is compatible with accelerometers, microphones, pressure transducers, force sensors and strain sensors. It can accept a direct voltage input signal, allowing it to be used with most voltage sensor signals.
LISTED UNDER: Test & MeasurementNAND/NOR Flash Programming System
August 2, 2007 7:04 am | Product Releases | CommentsBPM Microsystem’s Flashstream offers flash programming of NAND and NOR flash memory at speeds as low as 2.5 percent over the theoretical programming minimum. The company’s Vector Engine uses a proprietary co-processor design to hardware accelerate flash memory waveforms during the programming cycle. Faster speeds are achieved through synchronous operations that eliminate the dead times when the DUT waits on the programmer. The result is
LISTED UNDER: Test & MeasurementDual-Purpose 8 Gb/s Fibre Channel SAN Tester and Protocol Analyzer
July 30, 2007 11:20 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies Inc. introduced what is said to be the industry's only dual-purpose SAN tester and protocol analyzer for 8 Gb/s Fibre Channel (FC). Combining realistic network stimulus of the SAN tester application with sophisticated protocol analysis and troubleshooting capabilities allows engineers to speed up the design and development of next-generation storage devices. The module helps storage equipment manufactures conduct realistic tests on their device under test (DUT) early in the development and qualification cycle
LISTED UNDER: Test & MeasurementTime-to-Digital Converter for Timing-Measurement Applications
July 25, 2007 10:30 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies introduced the first time-to-digital converter (TDC) from its Acqiris product line, featuring six independent stopwatches for precise timing measurements from a common start event to multiple stop events at a high resolution. The TC890 is appropriate for time measurement applications, including laser detection and ranging (LIDAR) for 3D mapping and navigation, fluorescence lifetime spectrometry, and ion counting in time-of-flight mass spectrometry (TOFMS). Many pulse-timing measurements, such as period, frequency and time interval analysis (TIA), are suitable for the TDC's precise measurement technology.
LISTED UNDER: Test & MeasurementVisual Fault Locator in Rugged Pen Design
July 23, 2007 7:14 am | Product Releases | CommentsTyco Electronics hand held Visual Fault Locator is a rugged and affordable solution for identifying breaks and bending in optical fibers and cabling. Its red 650nm laser glows at the location of faults, in either continuous or pulsed modes. An AA-size battery provides 30 hours of continuous use and a soft-side protective case with belt loop is included, along with a lanyard dust cover.
LISTED UNDER: Test & MeasurementSampling Oscilloscope Probes Second Generation PCI Express, Serial ATA, XAUI and 10 Gigabit Ethernet
July 10, 2007 12:49 pm | Product Releases | CommentsLeCroy Corporation introduces WaveExpert 100H, said to be the first sampling oscilloscope capable of acquiring, measuring and processing signals that cannot be physically probed. It addresses the analysis and compliance requirements of the long serial data patterns required by standards such as second generation PCI Express, serial ATA, XAUI and 10 Gigabit Ethernet. The modular architecture supports up to four optical or electrical channels with bandwidths up to 100 GHz, as well as
LISTED UNDER: Test & Measurement
