Angular Rate and Acceleration Measurement

August 3, 2007 10:34 am | Product Releases | Comments

Systron Donner Automotive Div. introduces its Inertial Measurement Unit (IMU) that can simultaneously detect both angular-rate and acceleration along multiple axes. Packaged in a rugged housing, the device includes solid-state MEMS gyroscopes, accelerometers, a CAN interface, power conditioning and a microcontroller, all configured to meet the sensing and packaging requirements of any OEM or Tier 1 supplier.

LISTED UNDER: Test & Measurement

Power Meter for Start-Up of ATE Systems

August 3, 2007 7:50 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies, Inc. introduces its N8262A P-Series LXI-compliant power meter. This compact power meter is 1U high, and it supports LAN-based automated measurements of peak, peak-to-average ratio and average power. Its small size and ability to operate without shared power supplies, cardcages or system controllers enables a lower start-up cost for an automated test system.

LISTED UNDER: Test & Measurement

Probe Cards for Low Leakage Measurements

August 3, 2007 6:58 am | Product Releases | Comments

Celadon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs.

LISTED UNDER: Test & Measurement

Recording of Real-Time Data and Events

August 3, 2007 6:52 am | Product Releases | Comments

Real-Time Innovations (RTI) announces its RTI Recorder, a software system for logging the high-throughput data, events and messages that drive the behavior of distributed real-time applications. The recorded activity can be used for future analysis and debugging, regulatory compliance and replay for testing and simulation purposes.

LISTED UNDER: Test & Measurement

Jitter Test System

August 3, 2007 6:37 am | Product Releases | Comments

The Wireless Telecom Group Co. announces its Noise Com J7000 jitter test system that alters serial signal streams through injection of Gaussian noise in a way that reflects real world signal behavior. To evaluate performance of components and systems, it is capable of adding specific amounts of white noise to the signal stream that allows the measurement of signal-to-noise ratio (SNR), carrier-to-noise ratio (CNR) and bit-error-rate (BER).

LISTED UNDER: Test & Measurement

Four-channel Piezoelectric Sensor Signal Conditioner

August 3, 2007 6:28 am | Product Releases | Comments

PCB Piezotronics introduced Model 482C54, a compact benchtop signal conditioner for ICP, IEPE and charge output piezoelectric sensors. The signal conditioner is compatible with accelerometers, microphones, pressure transducers, force sensors and strain sensors. It can accept a direct voltage input signal, allowing it to be used with most voltage sensor signals.

LISTED UNDER: Test & Measurement

NAND/NOR Flash Programming System

August 2, 2007 7:04 am | Product Releases | Comments

BPM Microsystem’s Flashstream offers flash programming of NAND and NOR flash memory at speeds as low as 2.5 percent over the theoretical programming minimum. The company’s Vector Engine uses a proprietary co-processor design to hardware accelerate flash memory waveforms during the programming cycle. Faster speeds are achieved through synchronous operations that eliminate the dead times when the DUT waits on the programmer. The result is

LISTED UNDER: Test & Measurement

Dual-Purpose 8 Gb/s Fibre Channel SAN Tester and Protocol Analyzer

July 30, 2007 11:20 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. introduced what is said to be the industry's only dual-purpose SAN tester and protocol analyzer for 8 Gb/s Fibre Channel (FC). Combining realistic network stimulus of the SAN tester application with sophisticated protocol analysis and troubleshooting capabilities allows engineers to speed up the design and development of next-generation storage devices. The module helps storage equipment manufactures conduct realistic tests on their device under test (DUT) early in the development and qualification cycle

LISTED UNDER: Test & Measurement

Time-to-Digital Converter for Timing-Measurement Applications

July 25, 2007 10:30 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies introduced the first time-to-digital converter (TDC) from its Acqiris product line, featuring six independent stopwatches for precise timing measurements from a common start event to multiple stop events at a high resolution. The TC890 is appropriate for time measurement applications, including laser detection and ranging (LIDAR) for 3D mapping and navigation, fluorescence lifetime spectrometry, and ion counting in time-of-flight mass spectrometry (TOFMS). Many pulse-timing measurements, such as period, frequency and time interval analysis (TIA), are suitable for the TDC's precise measurement technology.

LISTED UNDER: Test & Measurement

Visual Fault Locator in Rugged Pen Design

July 23, 2007 7:14 am | Product Releases | Comments

Tyco Electronics hand held Visual Fault Locator is a rugged and affordable solution for identifying breaks and bending in optical fibers and cabling. Its red 650nm laser glows at the location of faults, in either continuous or pulsed modes. An AA-size battery provides 30 hours of continuous use and a soft-side protective case with belt loop is included, along with a lanyard dust cover.

LISTED UNDER: Test & Measurement

Sampling Oscilloscope Probes Second Generation PCI Express, Serial ATA, XAUI and 10 Gigabit Ethernet

July 10, 2007 12:49 pm | Product Releases | Comments

LeCroy Corporation introduces WaveExpert 100H, said to be the first sampling oscilloscope capable of acquiring, measuring and processing signals that cannot be physically probed. It addresses the analysis and compliance requirements of the long serial data patterns required by standards such as second generation PCI Express, serial ATA, XAUI and 10 Gigabit Ethernet. The modular architecture supports up to four optical or electrical channels with bandwidths up to 100 GHz, as well as

LISTED UNDER: Test & Measurement

High-Flow Temperature Forcing System

July 10, 2007 12:28 pm | Product Releases | Comments

Thermonics, Inc. announces the T-2500HFE precision temperature forcing system (PTFS) that provides increased air flow to control temperatures of high power electronic components and parallel component testing. The system controls device temperatures with power consumption of up to 140W to within ±1°C.

LISTED UNDER: Test & Measurement

Digital Power Meters

July 10, 2007 12:22 pm | Product Releases | Comments

Chroma ATE, Inc. announces its series 66200 digital power meter that is designed for accurate AC power measurements. The internal 16-bit analog/digital converters provide high speed sampling rates up to 240 KHz. In addition to standard power measurements, these power meters include inrush current, total harmonic Distortion of V/I and energy measurements.

LISTED UNDER: Test & Measurement

Temperature Meter with Audible Buzzer

July 10, 2007 12:18 pm | Product Releases | Comments

Omega Engineering introduces its DP7000 temperature meter that offers a wide temperature range, two selectable alarm settings and an internal buzzer that indicates alarm condition or error. The user can define set-point, ON/OFF heating/cooling regulation, alarm configuration, load status and ambient probe adjustment.

LISTED UNDER: Test & Measurement

Calibration Software Enhances RF Device Accuracy

July 10, 2007 12:12 pm | Product Releases | Comments

Cascade Microtech announces its WinCal XE calibration software to help semiconductor labs create more accurate high-frequency RF device models. The 16-term calibration eliminates certain undesired measurement parasitic effects, thus enabling more accurate device models and shorter design cycle times. Its flexible design and open architecture allow innovations and capabilities to be added quickly to the software.

LISTED UNDER: Test & Measurement


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