Graphical Test and Measurement Software
August 27, 2007 11:40 am | Product Releases | CommentsData Translation announced its Instrument Pak for Measure Foundry. It provides a drag-and-drop graphical software for LXI test and measurement applications. Users can configure applications with newer LXI instrument capabilities using IVICOM drivers along with existing VISA and SCPI programs. Measure Foundry is an open application builder that supports standard instruments such as function generator, oscilloscope, digital multimeter (DMM), and programmable power supplies for automated test equipment (ATE).
LISTED UNDER: Test & MeasurementMicroscopic Thermal Imaging Camera
August 27, 2007 11:28 am | On Semiconductor | Product Releases | CommentsOptoTherm, Inc. announces another version of its Micro thermal imaging system that includes a thermal imaging camera with greater sensitivity, 16-bit digital camera link interface, and a microscopic lens with 20 µm spatial resolution. It is used to detect shorts and defects on semiconductor devices and small circuit boards, and it can also measure junction temperature, identify die bonding defects and measure packaged die thermal resistance.
LISTED UNDER: Test & MeasurementDigital Temperature Indicators
August 27, 2007 11:22 am | Product Releases | CommentsSeaward Group USA introduced its Cropico range of high-accuracy digital temperature indicators that are designed for precision temperature measurement and calibration in a range of electronics, industrial, scientific and environmental monitoring applications. The three-model range offers a choice of inputs for platinum resistance thermometers and all popular thermocouple types. The 3000 model has inputs for Pt25 and Pt100 platinum resistance thermometers and thermocouples.
LISTED UNDER: Test & MeasurementData Acquisition System(2)
August 27, 2007 11:18 am | Product Releases | CommentsLDS Test and Measurement introduced its Dimension 4i data acquisition system that combines high speed, gap-free data recording with real time FFT analysis. It is a 16-channel, self-contained system that is capable of streaming all channels to its removable hard drive at 200 kS/s per channel. Each channel uses 24-bit analog to digital converters for maximum resolution and accuracy.
LISTED UNDER: Test & MeasurementTesting Wave 2 System Profiles
August 27, 2007 11:13 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies, Inc. announces an enhancement to its vector signal analyzer (VSA), signal studio and mobile WiMAX test Set measurement products to facilitate testing of the WiMAX Forum's Wave 2 system profiles. With their ability to test multiple input multiple output (MIMO) and other Wave 2 profile functionality, the systems provide up-to-date tools for engineers who require signal analysis, signal generation and end-to-end functional testing of mobile WiMAX.
LISTED UNDER: Test & MeasurementVector Programming System
August 27, 2007 11:09 am | Product Releases | CommentsBPM Microsystems' Flashstream offers flash programming of NAND and NOR flash memory at speeds as low as 2.5 percent over the theoretical programming minimum. The company’s Vector Engine uses a proprietary co-processor design to hardware accelerate flash memory waveforms during the programming cycle. Faster speeds are achieved through synchronous operations that eliminate the dead times when the DUT waits on the programmer.
LISTED UNDER: Test & MeasurementGraphical System Design Software Includes Real-Time Multicore Support
August 8, 2007 6:01 am | Product Releases | CommentsNational Instruments announced LabVIEW 8.5, the latest version of the graphical system design platform for test, control and embedded system development. The latest version combines the familiar graphical programming environment with commercial multicore hardware to achieve performance gains. Additionally, it introduces the LabVIEW Statechart Module for higher-level designs to run on targets including FPGAs, real-time systems, PDAs, touch panels and a variety of microprocessors
LISTED UNDER: Test & MeasurementSpectral Vibration Data Logger
August 6, 2007 5:06 am | Product Releases | CommentsThe OM-CP-SVR101 Spectral Vibration Recorder (SVR) from Omega Engineering is a self-contained device engineered to record acceleration data for spectral analysis of vibration and peaks. This device will record and time tag 3-axis vibrations and peaks to provide a history of shock/vibration conditions. It also records temperature once every sample period. It measures and computes real-time spectral data using an FFT(Fast Fourier Transform).
LISTED UNDER: Test & Measurement2.4X Spectrum Analyzer
August 3, 2007 10:59 am | Product Releases | CommentsMetaGeek announces its Wi-Spy 2.4X spectrum analyzer for resolving interference issues. With higher frequency resolution, amplitude resolution and amplitude range than previous models, it is easier to identify wireless signals that could be causing interference with Wi-Fi networks. Chanalyzer 2.1 software provides improved graphics, powerful play-thru controls and a user-friendly interface.
LISTED UNDER: Test & MeasurementSoftware for HDMI Compliance Test
August 3, 2007 10:55 am | Tektronix | Product Releases | CommentsTektronix, Inc. announces its TDSHT3 software that has been upgraded to support the HDMI compliance test specification version 1.3b. It is an HDMI compliance test software resident on a proprietary oscilloscope that controls the signal generators in a closed loop mechanism to automatically perform complex cable and sink tests.
LISTED UNDER: Test & MeasurementData Logger for CAN and ARINC-429 Bus
August 3, 2007 10:49 am | Product Releases | CommentsUnited Electronic Industries announces its UEILogger series that can log CAN and ARINC-429 bus data as well as RS-232, 422 and 485 ports. This functionality, combined with the logger’s small size and ruggedness (50g shock, -40°C to +85°C, 0 to 70,000 feet) makes it suitable for in-vehicle testing in the aerospace, aircraft, automotive, marine and rail transportation industries.
LISTED UNDER: Test & MeasurementHigh Speed Digitizers
August 3, 2007 10:44 am | Product Releases | CommentsGaGe announces its Cobra family of 8-bit high-speed digitizers. The digitizers are available with one or two digitizing channels, sampling speeds of up to 2 GS/s and up to 1 GHz input bandwidth. With up to 4 GS of on-board acquisition memory per card, they are suitable acquiring either large amounts of data simultaneously over long periods of time, or an extreme number of short data bursts.
LISTED UNDER: Test & MeasurementAngular Rate and Acceleration Measurement
August 3, 2007 10:34 am | Product Releases | CommentsSystron Donner Automotive Div. introduces its Inertial Measurement Unit (IMU) that can simultaneously detect both angular-rate and acceleration along multiple axes. Packaged in a rugged housing, the device includes solid-state MEMS gyroscopes, accelerometers, a CAN interface, power conditioning and a microcontroller, all configured to meet the sensing and packaging requirements of any OEM or Tier 1 supplier.
LISTED UNDER: Test & MeasurementPower Meter for Start-Up of ATE Systems
August 3, 2007 7:50 am | Agilent Technologies | Product Releases | CommentsAgilent Technologies, Inc. introduces its N8262A P-Series LXI-compliant power meter. This compact power meter is 1U high, and it supports LAN-based automated measurements of peak, peak-to-average ratio and average power. Its small size and ability to operate without shared power supplies, cardcages or system controllers enables a lower start-up cost for an automated test system.
LISTED UNDER: Test & MeasurementProbe Cards for Low Leakage Measurements
August 3, 2007 6:58 am | Product Releases | CommentsCeladon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs.
LISTED UNDER: Test & Measurement
