Arbitrary Waveform Function Generator

October 31, 2007 10:29 am | Product Releases | Comments

Geotest-Marvin Test Systems, Inc. announced its GX1110, a high performance single-channel PXI signal generator that offers both arbitrary waveform and DDS-based function generator capabilities within one instrument. It features 2M samples of memory, it supports a 100 MHz sample rate, and it is capable of generating low distortion sine waves up to 30 MHz.

LISTED UNDER: Test & Measurement

LXI Attenuator/Switch Drivers

October 31, 2007 10:25 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies, Inc. introduced its models 11713B and 11713C attenuator/switch drivers for both bench-top and ATE environments. These drivers provide an intuitive graphical user interface and a variety of attenuation and switching options, as well as front-panel and remote-control features for quick design validation and automated testing. The 11713B model drives a combination of two programmable attenuators and two SPDT switches or up to 10 SPDT switches concurrently.

LISTED UNDER: Test & Measurement

Hand-Portable Spectrum Analyzer

October 31, 2007 10:16 am | Product Releases | Comments

Willtek Communications announced its model 9103 handheld spectrum analyzer that operates at frequencies up to 7.5 GHz. It supports microwave applications, featuring all of the typical measurements of standard desktop spectrum analyzers such as channel power, occupied bandwidth and adjacent channel power ratio.

LISTED UNDER: Test & Measurement

PCI Express Waveform Digitizer

October 31, 2007 9:40 am | Product Releases | Comments

AlazarTech, Inc. announced its ATS9462, a four-lane PCI Express (PCIe) waveform digitizer for OEMs and R&D applications in RF signal analysis, biomedical imaging, OCT, ultrasonics, radar and lidar. The instrument provides 720 MB/s data throughput to PC memory. It has two simultaneous analog inputs that can each be sampled at rates up to 180 MS/s (one 16 bit 180 MSPS ADC per channel), providing a signal-to-noise ratio in excess of 73 dB.

LISTED UNDER: Test & Measurement

Wireless Data Acquisition Modules

October 31, 2007 9:36 am | Product Releases | Comments

Sealevel Systems, Inc. introduced its W-series SeaI/O family of data acquisition modules that is compatible with industry standards, communicating over 802.11b/g wireless networks using WEP, WPA-TKIP and WPA2-AES encryption standards. The modules operate from 9V DC to 30V DC, they are powered by terminal block or DC jack, and they are available with host connection options such as Ethernet, USB, RS-485 and RS-232.

LISTED UNDER: Test & Measurement

Multi-Functional PP Meters

October 31, 2007 9:31 am | Product Releases | Comments

Sartorius Mechatronics Corp. optimized its professional meters which are equipped with four analytical PP meter models with stable measuring results, secure data management and time-savings. The basic PP-15 meter measures pH and mV, ORP (redox) and temperature, while the PP-20 model also uses a dual-channel to include simultaneous measurement of conductivity, salinity, NaCl content or total dissolved solids (TDS) during pH/mV measurements.

LISTED UNDER: Test & Measurement

Meter for Semiconductor Parametric Analysis and Testing

October 31, 2007 7:42 am | Keithley Instruments | Product Releases | Comments

Keithley Instruments, Inc. announced its models 2635 and 2636 SourceMeter instruments that do parametric analysis at resolutions of 1fa (10A to 15A) which is required for many semiconductor, optoelectronic and nanotechnology devices. With their Test Script Processor (TSP) and TSP-Link intercommunications bus, these instruments enable engineers to create fast test systems that are suitable for research, characterization, wafer sort, reliability and production monitoring.

LISTED UNDER: Test & Measurement

Extreme-temperature Extension Cable for use in Oscilloscopes

October 30, 2007 5:14 am | Keysight Technologies | Product Releases | Comments

 Agilent Technologies Inc. announced the  N5450A InfiniiMax extreme-temperature extension cable, used with the company’s InfiniiMax Series probing system and Infiniium oscilloscopes, that give engineers the ability to probe signals at temperatures ranging from -55°C to 150°C. The cable is suitable for designers working in the cell phone, automotive electronics, storage device and consumer electronics industries who need to validate and characterize their designs while operating within extreme temperature ranges.

LISTED UNDER: Test & Measurement

PXI Products for Hybrid Test Systems in Production Applications

October 19, 2007 11:18 am | Keithley Instruments | Product Releases | Comments

Keithley Instruments, Inc. has introduced a new line of PXI products designed for high-speed automated production testing as part of a hybrid test system using precision instruments. The new KPXI product line consists of simultaneous data acquisition boards, multifunction analog I/O boards, high speed analog output boards, a 130 MS/sec digitizer module, digital I/O modules, PXI chassis, embedded PC controllers, MXI bridges

LISTED UNDER: Test & Measurement

Spectrum Analyzer Has Optional WCDMA Measurements

October 19, 2007 11:07 am | Product Releases | Comments

Anritsu Company has introduced its MS2717A Economy Spectrum Analyzer that offers general purpose spectrum analysis over the 100 kHz to 7.1 GHz frequency range. In addition to its performance and capabilities in analyzing RF components used in the wireless, aerospace/defense and university markets, it also offers optional WCDMA/HSDPA RF test and WCDMA detailed demodulation

LISTED UNDER: Test & Measurement

Integrated C-V Module

October 9, 2007 5:05 am | Keithley Instruments | Product Releases | Comments

Keithley Instruments, Inc. announces a C-V measurement instrument for its Model 4200-SCS Semiconductor Characterization System. The Model 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10 kHz to 10 MHz.

LISTED UNDER: Test & Measurement

Frequency Standard Features 20 MHz Synthesizer

October 2, 2007 11:24 am | Product Releases | Comments

Novatech Instruments, Inc. introduced the Model 2975AX Disciplined Quartz Frequency Standard. This bench-top instrument provides a cost-effective means to generate precise frequency reference signals for laboratory instruments, communication systems or other test and measurement equipment. Containing an ovenized quartz crystal time-base, the device has a stability of ±5 × 10-11 per day when disciplined to a 1 pps source

LISTED UNDER: Test & Measurement

Serial Analyzers for PCIe 2.0 Provide Power Management and Cross Bus Analysis

September 26, 2007 7:06 am | Tektronix | Product Releases | Comments

Tektronix announced new TLA7S16 and TLA7S08 Serial Analyzers for test and validation of PCI Express (PCIe) 1.0 and 2.0 designs. The devices provide detailed PCIe 2.0 protocol information along with cross-bus analysis. The new analyzers plug into the company’s TLA7000 Series logic analyzers, adding the ability to debug and correlate general purpose signals and other system interconnects including memory and computer processors.

LISTED UNDER: Test & Measurement

Test Options for 3G Radio Communications Analyzers

September 25, 2007 8:13 am | Product Releases | Comments

Anritsu Company introduces three options for its MT8820B/MT8815B radio communication analyzers that allow for fast and efficient testing of TD-SCDMA 3G mobile terminals. The MT8820B-007/MT8815B-007 TD-SCDMA measurement hardware, MX882007C TD-SCDMA measurement software and the MX882007C-001 TD-SCDMA voice codec options complement the inherent testing advantages of the analyzers to provide manufacturers with an efficient test tool for conducting call-processing, RF Rx/Tx and voice tests of TD-SCDMA mobile terminals.

LISTED UNDER: Test & Measurement

Analog/Mixed-Signal Test System

September 25, 2007 8:10 am | Product Releases | Comments

FETtest announces its AMX400, a modular, high-performance system for production analog/mixed-signal test applications. It offers a variety of instrumentation options, software for enterprise-wide test environments and support for avariety of devices. From wafer sort to final test, the system supports parallel testing of up to 32 multi-sites with 96 pin analog/digital stimulus/measure, software for test development and production test management and execution.

LISTED UNDER: Test & Measurement


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