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Graphical System Design Software Includes Real-Time Multicore Support

August 8, 2007 6:01 am | Product Releases | Comments

National Instruments announced LabVIEW 8.5, the latest version of the graphical system design platform for test, control and embedded system development. The latest version combines the familiar graphical programming environment with commercial multicore hardware to achieve performance gains. Additionally, it introduces the LabVIEW Statechart Module for higher-level designs to run on targets including FPGAs, real-time systems, PDAs, touch panels and a variety of microprocessors

LISTED UNDER: Test & Measurement

Spectral Vibration Data Logger

August 6, 2007 5:06 am | Product Releases | Comments

The OM-CP-SVR101 Spectral Vibration Recorder (SVR) from Omega Engineering is a self-contained device engineered to record acceleration data for spectral analysis of vibration and peaks. This device will record and time tag 3-axis vibrations and peaks to provide a history of shock/vibration conditions. It also records temperature once every sample period. It measures and computes real-time spectral data using an FFT(Fast Fourier Transform).

LISTED UNDER: Test & Measurement

2.4X Spectrum Analyzer

August 3, 2007 10:59 am | Product Releases | Comments

MetaGeek announces its Wi-Spy 2.4X spectrum analyzer for resolving interference issues. With higher frequency resolution, amplitude resolution and amplitude range than previous models, it is easier to identify wireless signals that could be causing interference with Wi-Fi networks. Chanalyzer 2.1 software provides improved graphics, powerful play-thru controls and a user-friendly interface.

LISTED UNDER: Test & Measurement
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Software for HDMI Compliance Test

August 3, 2007 10:55 am | Tektronix | Product Releases | Comments

Tektronix, Inc. announces its TDSHT3 software that has been upgraded to support the HDMI compliance test specification version 1.3b. It is an HDMI compliance test software resident on a proprietary oscilloscope that controls the signal generators in a closed loop mechanism to automatically perform complex cable and sink tests.

LISTED UNDER: Test & Measurement

Data Logger for CAN and ARINC-429 Bus

August 3, 2007 10:49 am | Product Releases | Comments

United Electronic Industries announces its UEILogger series that can log CAN and ARINC-429 bus data as well as RS-232, 422 and 485 ports. This functionality, combined with the logger’s small size and ruggedness (50g shock, -40°C to +85°C, 0 to 70,000 feet) makes it suitable for in-vehicle testing in the aerospace, aircraft, automotive, marine and rail transportation industries.

LISTED UNDER: Test & Measurement

High Speed Digitizers

August 3, 2007 10:44 am | Product Releases | Comments

GaGe announces its Cobra family of 8-bit high-speed digitizers. The digitizers are available with one or two digitizing channels, sampling speeds of up to 2 GS/s and up to 1 GHz input bandwidth. With up to 4 GS of on-board acquisition memory per card, they are suitable acquiring either large amounts of data simultaneously over long periods of time, or an extreme number of short data bursts.

LISTED UNDER: Test & Measurement

Angular Rate and Acceleration Measurement

August 3, 2007 10:34 am | Product Releases | Comments

Systron Donner Automotive Div. introduces its Inertial Measurement Unit (IMU) that can simultaneously detect both angular-rate and acceleration along multiple axes. Packaged in a rugged housing, the device includes solid-state MEMS gyroscopes, accelerometers, a CAN interface, power conditioning and a microcontroller, all configured to meet the sensing and packaging requirements of any OEM or Tier 1 supplier.

LISTED UNDER: Test & Measurement

Power Meter for Start-Up of ATE Systems

August 3, 2007 7:50 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies, Inc. introduces its N8262A P-Series LXI-compliant power meter. This compact power meter is 1U high, and it supports LAN-based automated measurements of peak, peak-to-average ratio and average power. Its small size and ability to operate without shared power supplies, cardcages or system controllers enables a lower start-up cost for an automated test system.

LISTED UNDER: Test & Measurement
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Probe Cards for Low Leakage Measurements

August 3, 2007 6:58 am | Product Releases | Comments

Celadon Systems, Inc. announces its VersaTile probe cards with a -65°C to 300°C operating temperature range for low leakage measuring of off currents, and a way to increase test throughput during wafer level reliability tests such as HCI, NBTI, TDDB and BTS. The probe card features a rigid ceramic and metal chassis with integrated cable strain reliefs.

LISTED UNDER: Test & Measurement

Recording of Real-Time Data and Events

August 3, 2007 6:52 am | Product Releases | Comments

Real-Time Innovations (RTI) announces its RTI Recorder, a software system for logging the high-throughput data, events and messages that drive the behavior of distributed real-time applications. The recorded activity can be used for future analysis and debugging, regulatory compliance and replay for testing and simulation purposes.

LISTED UNDER: Test & Measurement

Jitter Test System

August 3, 2007 6:37 am | Product Releases | Comments

The Wireless Telecom Group Co. announces its Noise Com J7000 jitter test system that alters serial signal streams through injection of Gaussian noise in a way that reflects real world signal behavior. To evaluate performance of components and systems, it is capable of adding specific amounts of white noise to the signal stream that allows the measurement of signal-to-noise ratio (SNR), carrier-to-noise ratio (CNR) and bit-error-rate (BER).

LISTED UNDER: Test & Measurement

Four-channel Piezoelectric Sensor Signal Conditioner

August 3, 2007 6:28 am | Product Releases | Comments

PCB Piezotronics introduced Model 482C54, a compact benchtop signal conditioner for ICP, IEPE and charge output piezoelectric sensors. The signal conditioner is compatible with accelerometers, microphones, pressure transducers, force sensors and strain sensors. It can accept a direct voltage input signal, allowing it to be used with most voltage sensor signals.

LISTED UNDER: Test & Measurement

NAND/NOR Flash Programming System

August 2, 2007 7:04 am | Product Releases | Comments

BPM Microsystem’s Flashstream offers flash programming of NAND and NOR flash memory at speeds as low as 2.5 percent over the theoretical programming minimum. The company’s Vector Engine uses a proprietary co-processor design to hardware accelerate flash memory waveforms during the programming cycle. Faster speeds are achieved through synchronous operations that eliminate the dead times when the DUT waits on the programmer. The result is

LISTED UNDER: Test & Measurement

Dual-Purpose 8 Gb/s Fibre Channel SAN Tester and Protocol Analyzer

July 30, 2007 11:20 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. introduced what is said to be the industry's only dual-purpose SAN tester and protocol analyzer for 8 Gb/s Fibre Channel (FC). Combining realistic network stimulus of the SAN tester application with sophisticated protocol analysis and troubleshooting capabilities allows engineers to speed up the design and development of next-generation storage devices. The module helps storage equipment manufactures conduct realistic tests on their device under test (DUT) early in the development and qualification cycle

LISTED UNDER: Test & Measurement

Time-to-Digital Converter for Timing-Measurement Applications

July 25, 2007 10:30 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies introduced the first time-to-digital converter (TDC) from its Acqiris product line, featuring six independent stopwatches for precise timing measurements from a common start event to multiple stop events at a high resolution. The TC890 is appropriate for time measurement applications, including laser detection and ranging (LIDAR) for 3D mapping and navigation, fluorescence lifetime spectrometry, and ion counting in time-of-flight mass spectrometry (TOFMS). Many pulse-timing measurements, such as period, frequency and time interval analysis (TIA), are suitable for the TDC's precise measurement technology.

LISTED UNDER: Test & Measurement

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