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Rohde & Schwarz Provides All-In-One LTE Drive Test Scanner

November 10, 2011 7:32 am | Product Releases | Comments

Rohde & Schwarz has developed a multi-functional universal radio network analyzer that provides advanced drive testing. The R&S TSMW drive test scanner supports LTE (Long Term Evolution) formats in all current and future wireless communication bands, with no additional costs.

LISTED UNDER: Test & Measurement
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Three-Phase Power Quality Analyzers Directly Measure Energy Wasted in Electrical Systems

November 10, 2011 5:08 am | Product Releases | Comments

Fluke Corporation introduced the Fluke 430 Series II three-phase power quality analyzers, the first tools to use a patented algorithm to measure energy waste and quantify its cost.

LISTED UNDER: Test & Measurement

Fault Insertion PXI Modules Include 10 Channels

November 9, 2011 12:41 pm | Product Releases | Comments

Pickering Interfaces is expanding its range of over 20 PXI Fault Insertion solutions with the introduction of the 40-199. Fault Insertion (FI) modules are used within an Automatic Test System to simulate common fault conditions such as an open, short to ground or a short to

LISTED UNDER: Boards & Modules | Electromechanical/Mechanical Devices | Test & Measurement

Collaboration Brings SYSGO PikeOS Virtualization to MIPS32 Cores

November 9, 2011 10:14 am | Product Releases | Comments

MIPS Technologies and SYSGO announced they are collaborating to bring SYSGO’s embedded virtualization technology to MIPS32 processor cores. 

LISTED UNDER: Software | Test & Measurement

Hall Effect Measurement Fundamentals

November 9, 2011 5:41 am | Videos | Comments

This video from Keithley shows how to make Hall effect measurements as they relate to semiconductor materials and device characterization.

LISTED UNDER: Test & Measurement

Digital Panel Meter Delivers Dual Counter, Dual Rate Meter with Math Functions

November 8, 2011 12:52 pm | Product Releases | Comments

Red Lion Controls announced the latest addition to its rugged PAX2 Series of dual line display meters. The PAX2D Digital Panel Meter is a single package featuring a dual counter and dual rate meter, with a third counter and rate display that allows the user to perform math functions. With universal features and versatile programming capabilities, this single meter can

LISTED UNDER: Optoelectronics & Displays | Test & Measurement

Kit Helps Determine Vulnerability of VFD-Controlled Motors

November 7, 2011 7:04 am | Product Releases | Comments

The new AEGIS Shaft Voltage Test Kit is said to make it easier than ever to measure and document damaging VFD-induced voltages while there is still time to head off bearing damage and equipment downtime. Because the kit is

LISTED UNDER: Electromechanical/Mechanical Devices | Test & Measurement

Multichannel Data Converter More Than Doubles Signal Bandwidth

November 4, 2011 7:06 am | Product Releases | Comments

Pentek announced its fastest ever multichannel data converter with digital down and up converters. With two channels each of 12-bit, 500 MHz A/D and 16-bit, 800 MHz D/A, the Model 71651 delivers more than twice the bandwidth of Pentek’s previous data converters.

LISTED UNDER: Boards & Modules | Test & Measurement

Surface Mountable Accelerometers Supports High-g Shock Measurement Requirements

November 3, 2011 8:39 am | Product Releases | Comments

Meggitt Sensing Systems has introduced the Endevco model 71M series, a family of rugged, undamped subminiature surface mountable piezoresistive accelerometers, designed to support a variety of high-g shock measurement requirements.

LISTED UNDER: Sensors & Actuators | Test & Measurement

World’s first Voice over LTE test solution for audio quality measurements

November 3, 2011 5:45 am | Product Releases | Comments

Rohde & Schwarz has developed the world’s first Voice over LTE (VoLTE) test solution for audio quality measurements. By combining the R&S CMW500 Wideband Radio Communication Tester emulating an LTE network, and the R&S UPV Audio Analyzer...

LISTED UNDER: Test & Measurement

Tektronix Announces Industry’s Fastest Coherent Lightwave Signal Analyzer

November 2, 2011 10:35 am | Tektronix | Product Releases | Comments

Tektronix announced the OM4106D Coherent Lightwave Signal Analyzer – the first coherent test system with 33 GHz bandwidth support. This industry-fastest performance is achieved through tight integration with the DPO70000D Series oscilloscopes...

LISTED UNDER: Test & Measurement

Programmable DC Power Supplies Suit ATE applications

November 1, 2011 2:56 pm | TDK-Lambda Americas, Inc. | Product Releases | Comments

Z+ Series programmable DC power supplies from TDK-Lambda are designed to meet the demands of a wide variety of ATE and OEM applications, such as Test & Measurement, Semiconductor Burn-in, Component Test, Laser Diode, Heater Supplies, RF Amplifiers and Electromagnets.

LISTED UNDER: Test & Measurement

Analyzers Tout Patented Algorithm to Measure Energy Waste and Quantify Its Cost

November 1, 2011 11:02 am | Product Releases | Comments

Fluke Corporation introduced the Fluke 430 Series II three-phase power quality analyzers, which are said to be the first tools to use a patented algorithm to measure energy waste and quantify its cost. The series helps facilities reduce electrical power consumption and improve

LISTED UNDER: Test & Measurement

350 MHz Synthesizer and Clock Generator Comes in Small Shielded Table Top Case

October 31, 2011 3:10 pm | Product Releases | Comments

Novatech Instruments, Inc. introduced Model 425A, a Precision 350 MHz DDS Signal Generator packaged in a small shielded table top case. The device generates sine wave, LVDS, and LVCMOS output signals simultaneously. The generated sine wave output

LISTED UNDER: Test & Measurement

Multitest’s Quad Tech Designed for Best Contacting Integrity

October 31, 2011 6:11 am | Product Releases | Comments

Multitest announces that its Quad Tech concept is the next generation of vertical contact technology. Its superior test yield and long probe life results in significant cost of test advantages.

LISTED UNDER: Test & Measurement

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