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Single-pulse LED measurement system eases binning

April 30, 2012 11:46 am | Product Releases | Comments

Gigahertz-Optik has developed a measurement system for LED binning consisting of the BTS256-LED tester and LPS-20-1500 LED power supply with S-BTS256 software to assist with single pulse LED binning. Both meter, power supply and control software work in tandem to

LISTED UNDER: Optoelectronics & Displays | Test & Measurement

"Connector Saver" with stainless steel coupling nut reduces testing expense

April 25, 2012 9:31 am | Product Releases | Comments

7-16 DIN connectors are large format 50 ohm interfaces designed for high power wireless telecommunications applications such as antennas, base stations, and satellite communications. Test ports are subject to minimal wear each time the connector interface is coupled and de-coupled. Contact pins and dielectrics can be damaged if connectors are misaligned during coupling.

LISTED UNDER: Packaging & Interconnects | Test & Measurement

XJTAG releases second generation PXI boundary scan solution

April 20, 2012 1:47 pm | Product Releases | Comments

  XJTAG today released its second generation PXI boundary scan solution – a high speed interface that allows the integration of XJTAG boundary scan with PXI-based test systems. The PXI XJLink2 enables users of PXI chassis, such as NI LabVIEW and LabWindows, to leverage the benefits of XJTAG's XJLink2 boundary scan controller from within their integrated PXI test platform.  

LISTED UNDER: Software | Test & Measurement
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Magnetic rotary encoder IC offers reliable measurements in noisy industrial environments

April 18, 2012 11:36 am | Product Releases | Comments

austriamicrosystems released the AS5048, a 14-bit magnetic encoder IC offering new features which make it easier than ever to achieve accurate, reliable angle measurements in microcontroller-based applications. The AS5048, which provides a PWM output and either an SPI or I2C interface...

LISTED UNDER: ICs | Test & Measurement

T3 Innovation launches new Tel-Scope Telecomm Test Set

April 12, 2012 1:48 pm | Product Releases | Comments

T3 Innovation (t3innovation.com) has announced the launch of the new TLA300 Tel-Scope Telecomm Test Set. Scheduled to ship in May with an MSRP of $269.95, the Tel-Scope delivers more line condition and status information than any other telephone line tester in the world.

LISTED UNDER: Test & Measurement

Probing solutions enable higher speed memory capture

April 5, 2012 10:00 am | Tektronix | Product Releases | Comments

Tektronix announced the next generation of DDR3 probing solutions for logic debug and protocol validation using the Tektronix TLA7000 Series Logic Analyzers with support for DDR3-2133 MT/s and DDR3-2400 MT/s. This is the highest performing DDR3 protocol test solution in the market today.

LISTED UNDER: Test & Measurement

Corelis announces Multi-TAP JTAG solution for Teradyne ICTs

April 4, 2012 5:52 am | Product Releases | Comments

Following the recent USB-1149.1/CFM announcement showcasing a high-performance single-channel JTAG hardware platform for Teradyne ICTs, Corelis, Inc. announced today the QuadTAP/CFM, a four-channel JTAG hardware platform that seamlessly integrates advanced boundary-scan test capabilities...

LISTED UNDER: Test & Measurement

Tek delivers Thunderbolt Technology test solution

April 3, 2012 4:49 am | Tektronix | Product Releases | Comments

Tektronix announced a comprehensive test solution for Thunderbolt technology. Thunderbolt is a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements.

LISTED UNDER: Test & Measurement
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Meggitt Sensing Systems announces Endevco 1-4'' microphone preamplifier

March 30, 2012 5:23 am | Product Releases | Comments

Meggitt Sensing Systems, a Meggitt group division, has announced the Endevco model EM26CB, a ¼” ISOTRON microphone preamplifier with Microdot coaxial connector, designed for use with prepolarized condenser microphones...

LISTED UNDER: Test & Measurement

Data Acquisition System Includes Analytical Software

March 22, 2012 8:02 am | Product Releases | Comments

iWorx has introduced the IX-404E Data Acquisition System for OEM applications that require data recording and analysis. The system features four single-ended analog inputs and a 16 bit analog-to-digital converter. It is capable of

LISTED UNDER: Boards & Modules | Test & Measurement

Source Measurement Instrument Accommodates High Power Semiconductor Test

March 22, 2012 5:54 am | Keithley Instruments | Product Releases | Comments

Keithley Instruments introduced its Model 2657A High Power System SourceMeter instrument. The device adds high voltage to the company’s Series 2600A System SourceMeter family of high speed, precision source measurement units. Together, these instruments allow

LISTED UNDER: Test & Measurement

TDK announces web-based R-T tool for EPCOS NTC thermistors

March 21, 2012 5:13 am | Product Releases | Comments

TDK-EPC announces a browser-based NTC R/T Calculation 5.0 tool for calculating the R/T characteristics of EPCOS NT thermistors. The download and installation of special software are no longer necessary, and users always have access to the current EPCOS product database.

LISTED UNDER: Test & Measurement

Instrument Combines Function-Arbitrary Waveform Functions and Aims to Simplify Test Benches

March 12, 2012 6:43 am | Product Releases | Comments

B&K Precision announced models 2540B-GEN and 2542B-GEN – the latest additions to its 2540B Series of digital storage oscilloscopes. The integration of function/arbitrary waveform generation capability into these 60 MHz and 100 MHz, 1 GSa/s DSOs provides

LISTED UNDER: Test & Measurement

Avnet Electronics Marketing Americas adds quartz timing devices from Epson to offering

March 7, 2012 8:57 am | Product Releases | Comments

Avnet Electronics Marketing Americas, a business region of Avnet, announced a distribution agreement with Epson Electronics America, Inc. (EEA). This agreement makes EEA quartz-based products available to Avnet’s customers in the Americas.

LISTED UNDER: Test & Measurement

Tektronix to provide first automated test solution for MHL CTS 1.2

March 6, 2012 9:18 am | Tektronix | Product Releases | Comments

Tektronix announced availability of an automated test solution for the latest Mobile High-Definition Link (MHL) Compliance Test Specification (CTS) 1.2 covering transmitter, receiver and dongle testing for both physical (PHY) and protocol layers.

LISTED UNDER: Test & Measurement

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