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JTAG module addresses analogue testing

June 20, 2012 12:34 pm | Product Releases | Comments

JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.

LISTED UNDER: Boards & Modules | Test & Measurement

USB sensor features compact size for field applications

June 19, 2012 3:07 pm | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. today announced the Agilent U2020 X-series. These compact, high-performance USB sensors allow engineers to test devices quickly and accurately.

LISTED UNDER: Sensors & Actuators | Test & Measurement

Coaxial switch has guaranteed 5 million cycle operating life

June 19, 2012 9:56 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. announced a USB-powered, single-pole double-throw coaxial switch, operating from DC to 18 GHz. The first-to-market microwave switch driven by a USB port, the Agilent U1810B will provide system-design and manufacturing engineers a long-operating-life solution with convenient RF switching.

LISTED UNDER: Test & Measurement
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PNA-L vector network analyzer models offer high performance, low cost

June 13, 2012 3:44 pm | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. (NYSE: A) today introduced five new PNA-L vector network analyzer models, offering design and manufacturing engineers the highest performance (up to 50 GHz) in a mid-range VNA, along with lower cost and future-proof capabilities.

LISTED UNDER: Test & Measurement

Memory test system reduces power consumption by 90 percent

June 8, 2012 12:23 pm | Product Releases | Comments

Advantest Corporation (TSE: 6857, NYSE: ATE) today announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components.

LISTED UNDER: Test & Measurement

New test solution utilizes cloud computing technology

June 8, 2012 12:18 pm | Product Releases | Comments

Advantest Corporation today announced that it will launch a new test solution, dubbed CloudTestingTM Service (CTS), which utilizes cloud computing technology to offer cutting-edge test technology for semiconductor device R&D and design applications.

LISTED UNDER: Test & Measurement

Test instrument promises to help embedded system engineers maximize efficiency

June 6, 2012 5:13 pm | Product Releases | Comments

Ix Innovations announced the general availability of its PocketPico P200 PowerMate energy optimization instrument. Designed specifically for embedded systems engineers and other low power electronics developers, the instrument accurately measures current from

LISTED UNDER: Test & Measurement

Corelis releases new CD Version 7.7 Boundary-Scan Tool Suite

May 24, 2012 8:44 am | Product Releases | Comments

Corelis announced today the availability of version 7.7 of its ScanExpress Boundary-Scan Tool Suite. This new version covers a wide range of new features and enhancements including improved constraints handling, support for multi-core devices, and new JTAG Embedded Test support for additional Freescale and Texas Instruments processors.

LISTED UNDER: Software | Test & Measurement
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Clock oscillator offers ultra-low phase noise

May 22, 2012 11:26 am | Product Releases | Comments

Crystek Corporation’s Ultra-Low Phase Noise CCHD-950 Series HCMOS Clock Oscillator pushes the phase noise performance benchmark with a -168 dBc/Hz noise floor (100 MHz model).

LISTED UNDER: Test & Measurement

Controller kits tap into high-speed PCIe bus

May 19, 2012 12:08 pm | Product Releases | Comments

Two new controller kits for the ScanWorks platform for embedded instruments from ASSET InterTech can, according to the company accelerate test throughput by plugging into the high-speed PCI Express (PCIe) bus in the personal computer where ScanWorks is running.

LISTED UNDER: Boards & Modules | Test & Measurement

High-speed memory test system offers multi-functionality and industry’s top test speed of 8Gbps

May 14, 2012 2:54 pm | Product Releases | Comments

Advantest Corporation today announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8Gbps.

LISTED UNDER: Test & Measurement

Tester targets photovoltaic modules and strings

May 14, 2012 9:32 am | Product Releases | Comments

MC Technologies’ PROFITEST-PV allows the measurement of I-U-parameters as well as photovoltaic-modules and strings. A new patented procedure enables the test unit to read peak power, serial resistance, parallel resistance at the same time. All information can

LISTED UNDER: Test & Measurement

2-in-1 insulation tester & multimeter includes wireless datalogging

May 11, 2012 1:23 pm | Product Releases | Comments

Extech Instruments announces the new MG300, a true RMS multimeter with built-in insulation resistance tester and the added safety of wireless datastreaming for remote monitoring and datalogging. By adding insulation testing capabilities to the ubiquitous digital multimeter, electricians are always equipped for insulation testing...

LISTED UNDER: Test & Measurement

Development kit helps build personalized pulse networks

May 8, 2012 9:48 am | Product Releases | Comments

Teseq offers a development kit that allows automotive technicians and engineers to design their own pulse networks.  By using the FLX 5510 in conjunction with Teseq’s NSG 5500, automotive EMC laboratories can design their own pulses as well as

LISTED UNDER: Test & Measurement

GOEPEL electronics improves flexibility of JTAG I/O modules using FPGA embedded instruments

May 3, 2012 9:44 am | Product Releases | Comments

GOEPEL electronics introduced ChipVORX Module, a special FPGA based I/O module product line. The new modules are controlled via a standard TAP enabling access to the entire ChipVORX eco system of test and programming IPs for external instrumentation.

LISTED UNDER: Boards & Modules | Test & Measurement

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