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Multi-band PIM analyzers include s-parameter capability

August 27, 2014 10:37 am | Product Releases | Comments

AWT Global has launched a new product line of passive intermodulation (PIM) analyzers for manufacturing, R&D and QA: PEM42A Series. These new PIM analyzers can handle up to four frequency bands in the range of 385 MHz to 2600 MHz.

LISTED UNDER: Test & Measurement | Measurement | Frequency

6000-W electronic load offers 1000-V high voltage capability

August 26, 2014 11:03 am | Intepro Systems | Product Releases | Comments

Intepro Systems (Berkshire, UK) introduced a high voltage EL9718E-M1 1000-V 6-kw electronic load. The EL9718E-M1 electronic load has been developed specifically to meet high voltage applications and offers …

LISTED UNDER: Test & Measurement | Test

USB pen scope displays signals from 5mV to 50V

August 21, 2014 4:27 pm | Saelig Company, Inc. | Product Releases | Comments

Saelig Company Inc. (Fairport, NY) announces the new Owon RDS1021 Wave Rambler — a new, USB pen scope that packs the features of a high-performance bench top oscilloscope in a small, lightweight and ergonomic probe that fits perfectly in the hand....

LISTED UNDER: Test & Measurement | Probes | Oscilloscope
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Transmitters and converters provide fast response time and low temperature drift

August 15, 2014 9:28 am | Product Releases | Comments

With selected devices featuring HART 7 technology, the entire 3000 series of compact best-in-class temperature transmitters and converters from PR Electronics (San Diego, CA) provides high accuracy, fast response time, and low temperature drift....

LISTED UNDER: Temperature

Test probe cable assemblies designed for the inspection of high-frequency circuits

August 11, 2014 9:31 am | Product Releases | Comments

GradConn (Boca Raton, FL) has launched a new range of low-cost co-axial test probe cable assemblies for the inspection of high frequency circuits. Suitable for testing Hirose MS-156 and Murata MM8030 sub miniature coaxial switch connectors ...

LISTED UNDER: Test & Measurement | Probes | Test

Four-slot, rugged CompactDAQ controller integrates an Intel Atom processor and high-accuracy measurements

August 7, 2014 2:46 pm | National Instruments | Product Releases | Comments

NI (Austin, TX) announced the CompactDAQ four-slot controller. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, engineers and scientists can reduce overall system cost and complexity while increasing

LISTED UNDER: Test & Measurement | Measurement

Test platform enables automated software tests directly on the target system

August 7, 2014 1:54 pm | Product Releases | Comments

PLS Programmierbare Logik & Systeme and Razorcat now present a whole range of optimized, so-called Tool Qualification Packages (TQPs) for the TESSY test platform for various architectures and cross compilers. These TQPs will in the future ...

LISTED UNDER: Test & Measurement | Test

Programmable power supplies test battery-powered devices, low power semiconductors

August 6, 2014 4:40 pm | Product Releases | Comments

Keithley Instruments (Cleveland, OH) introduced the Series 2280S precision measurement, low noise, programmable DC power supplies featuring the speed and dynamic range essential for measuring standby current loads....

LISTED UNDER: Bench | Programmable | Measurement
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6GHz handheld RF spectrum analyzers provide more than 3 hours of operation

August 5, 2014 12:34 pm | Saelig Company, Inc. | Product Releases | Comments

Saelig Company, Inc. (Fairport, NY) has introduced two new RF analyzers — the new AIM-TTi Series 5 Models — available in 3.6GHz and 6.0GHz versions. They maintain a true handheld format while offering bench-top instrument-quality features....

LISTED UNDER: Test & Measurement | RF/Microwave

Touch-screen digital oscilloscope includes 7.6MSa record length

July 28, 2014 4:20 pm | Saelig Company, Inc. | Product Releases | Comments

Saelig Company Inc. (Fairport, NY) announces the Owon TDS7102 — a new, 100MHz four-channel benchtop scope, with touch-screen capabilities that make instrument setting, operation, and adjustment faster and more intuitive. With 1GSa/s signal capturing on all four channels simultaneously ...

LISTED UNDER: Test & Measurement | Oscilloscopes | Digital

Eight-channel Type K thermocouple amplifier signal conditioner suits industrial applications

July 16, 2014 2:15 pm | Product Releases | Comments

The Sensor Connection (Troy, MI) has expanded its line of measurement and control instrumentation with the addition of the model TCA-MS-K-8-A4.  This eight-channel Type K Thermocouple Amplifier Module converts the low output voltage signal from 8 Type K thermocouple probes to eight…

LISTED UNDER: Measurement

Test solution designed for characterizing USB 3.1 receivers

July 14, 2014 3:29 pm | Keysight Technologies | Product Releases | Comments

Agilent Technologies (Santa Clara, CA) announced an accurate test solution for characterizing USB 3.1 receivers. Using the Agilent USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets....

LISTED UNDER: Test & Measurement | Test

Data loggers features wireless two-way communication with pulse input

July 14, 2014 10:30 am | Omega Engineering | Product Releases | Comments

Omega’s (Stamford, CT) new series of wireless pulse data loggers features wireless two-way communication with pulse input for monitoring wind speed, energy or flow rate. The data logger has a digital display that shows data in real time, a battery life indicator and audible and LED alarm indicators.

LISTED UNDER: Data Loggers

Oscilloscopes integrate a deep measurement toolset

July 1, 2014 3:17 pm | Product Releases | Comments

Teledyne LeCroy (Chestnut Ridge, NY) has introduces the WaveSurfer 3000 series of oscilloscopes featuring the MAUI advanced user interface. This user interface integrates a deep measurement toolset and multi-instrument capabilities into a user experience centered on a large 10.1” touch screen....

LISTED UNDER: Oscilloscopes

Multi-channel PXI-based test solution speeds LTE/LTE-Advanced waveform creation and analysis

July 1, 2014 10:34 am | Keysight Technologies | Product Releases | Comments

Agilent Technologies Inc. (Santa Clara, CA) announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which is positioned to accelerate the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and…

LISTED UNDER: Test

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