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Measurement

Four-slot, rugged CompactDAQ controller integrates an Intel Atom processor and high-accuracy measurements

August 7, 2014 2:46 pm | National Instruments | Product Releases | Comments

NI (Austin, TX) announced the CompactDAQ four-slot controller. By integrating the processor, signal conditioning and I/O into a single CompactDAQ system, engineers and scientists can reduce overall system cost and complexity while increasing

LISTED UNDER: Test & Measurement | Measurement

Programmable power supplies test battery-powered devices, low power semiconductors

August 6, 2014 4:40 pm | Product Releases | Comments

Keithley Instruments (Cleveland, OH) introduced the Series 2280S precision measurement, low noise, programmable DC power supplies featuring the speed and dynamic range essential for measuring standby current loads and load current pulses that

LISTED UNDER: Bench | Programmable | Measurement

Touch-screen digital oscilloscope includes 7.6MSa record length

July 28, 2014 4:20 pm | Saelig Company, Inc. | Product Releases | Comments

Saelig Company Inc. (Fairport, NY) announces the Owon TDS7102 — a new, 100MHz four-channel benchtop scope, with touch-screen capabilities that make instrument setting, operation, and adjustment faster and more intuitive. With 1GSa/s signal capturing on all four channels simultaneously ...

LISTED UNDER: Test & Measurement | Oscilloscopes | Digital
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Eight-channel Type K thermocouple amplifier signal conditioner suits industrial applications

July 16, 2014 2:15 pm | Product Releases | Comments

The Sensor Connection (Troy, MI) has expanded its line of measurement and control instrumentation with the addition of the model TCA-MS-K-8-A4.  This eight-channel Type K Thermocouple Amplifier Module converts the low output voltage signal from 8 Type K thermocouple probes to eight…

LISTED UNDER: Measurement

Oscilloscopes integrate a deep measurement toolset

July 1, 2014 3:17 pm | Product Releases | Comments

Teledyne LeCroy (Chestnut Ridge, NY) has introduces the WaveSurfer 3000 series of oscilloscopes featuring the MAUI advanced user interface. This user interface integrates a deep measurement toolset and multi-instrument capabilities into a user experience centered on a large 10.1” touch screen....

LISTED UNDER: Oscilloscopes

Dust monitor detects particles as small as 0.3 µm

June 30, 2014 1:53 pm | Yokogawa | Product Releases | Comments

Yokogawa Corporation of America (Newnan, GA) announces the release of the model DT450G dust monitor. The DT450G detects the qualitative level of dust or particulate matter by working off of the principle of inductive electrification. This probe provides a highly sensitive measurement....

LISTED UNDER: Meters

8-channel, 12-bit oscilloscope features up to 1 GHz of bandwidth

June 18, 2014 11:15 am | Product Releases | Comments

Teledyne LeCroy announced the HDO8000 oscilloscope product line with 8 analog input channels, 12-bits of vertical resolution utilizing Teledyne LeCroy’s HD4096 technology, and up to 1 GHz of bandwidth. The HDO8000 oscilloscopes have maximum performance....

LISTED UNDER: Oscilloscopes

Battery-free RFID resistance tag measures resistance value with a 10Ohm to 10MOhm range

June 12, 2014 2:15 pm | Product Releases | Comments

The RMETER from Farsens S.L. (San Sebastián, Spain) is a battery-free RFID sensor tag capable of transmitting a unique identifier and the associated resistance measurement data to a commercial EPC C1G2 reader without the need of a battery on the sensor tag....

LISTED UNDER: Meters
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AC/DC Hall effect measurement system includes 7-inch magnet

April 18, 2014 10:52 am | Lake Shore Cryotronics | Product Releases | Comments

The new Model 8407 Hall effect measurement system from Lake Shore Cryotronics (Westerville, OH) features a 7-inch magnet for measuring mobilities at the low end of the DC field measurement range, from 1 to 106 cm2/V s. Like Lake Shore’s existing Model 8404 with 4-inch magnet, it can be ordered with AC field measurement capabilities....

LISTED UNDER: Meters

Measuring machine features accuracy as low as 0.7µm

April 17, 2014 11:00 am | Product Releases | Comments

Mitutoyo America Corporation (Aurora, IL) announces the new STRATO-Apex574 Coordinate Measuring Machine to its STRATO-Apex line of CMMs. This new configuration offers a more compact footprint while still offering the same state-of-the-art blend of high-speed operation....

LISTED UNDER: Probes

Oscilloscopes add enhanced IBIS-AMI, S-parameters modeling support

April 15, 2014 2:26 pm | Tektronix | Product Releases | Comments

Tektronix (Beaverton, OR) extended the capabilities of the analysis system on its MSO/DPO70000 Series of Digital and Mixed Signal Oscilloscopes to include modeling of on-chip silicon behavior using IBIS-AMI models and S-parameters. This

LISTED UNDER: Oscilloscopes

Four-channel portable oscilloscope samples at 5 GS/s

April 10, 2014 3:25 pm | Fluke Corporation | Product Releases | Comments

Fluke Corp. introduced its 190-504 Series II 500 MHz ScopeMeter Portable Oscilloscope, said to be the first to achieve a 500 MHz at 5 GS/s real time sample rate in a four-channel handheld, sealed, and rugged oscilloscope without compromising

LISTED UNDER: Oscilloscopes

Oscilloscope offers powerful analysis tools at bandwidths from 200 MHz to 1 GHz, powerful analysis tools

March 12, 2014 2:32 pm | Rohde & Schwarz | Product Releases | Comments

The new R&S RTE from Rohde & Schwarz (Munich) is available with bandwidths from 200 MHz to 1 GHz. An acquisition rate of more than one million waveforms per second helps users find signal faults quickly. The scope's accurate digital trigger system with virtually no trigger jitter is

LISTED UNDER: Oscilloscopes

Digital oscilloscope offers greater signal resolution and accuracy

January 28, 2014 2:29 pm | Rigol Usa | Product Releases | Comments

Rigol Technologies announces the DS2000A series Digital Oscilloscope, the latest addition to its extensive family of test and measurement equipment. Featuring Rigol's powerful UltraVision technology, the DS2000A delivers unprecedented value with its high sample rate, long record length, wide vertical range, low noise floor and exceptional pricing.

LISTED UNDER: Oscilloscopes

X-ray metrology platform provides precision, detection, and throughput for fully automated wafer measurement

January 20, 2014 12:06 pm | Product Releases | Comments

Nordson DAGE announces the launch of its XM8000 Wafer X-ray Metrology Platform at the SEMI European 3D TSV Summit taking place in Grenoble, France 20-22 January 2014. This new platform takes the market-leading capabilities from Nordson DAGE’s existing X-ray systems to provide an automated, high-throughput X-ray metrology and defect review system....

LISTED UNDER: Meters

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