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CableEye® M3U Cable Tester System: Item 821U

March 3, 2015 5:00 pm | CAMI Research, Inc. | Products

For diagnostic and Pass/Fail Testing — Find, display, log, document: opens, shorts, miswires, intermittent connections, continuity, contact and isolation resistance, embedded resistors and diodes. • 152 Test point base unit (for ≤76-conductor cable) • Expandable to 2560 test points (for >76-conductor cable) • Resistance measurement 0.3Ω-10MΩ • Graphical User Interface (GUI) • 9x12" bench footprint
 ◊ Includes: CB15 board set (Item 745), PC s/w, DB of >200 standard cables, 1yr warranty, 1yr free tech support, one-year free software and database upgrades. USB interface standard. ◊ If cables will never exceed 64 conductors, the M2-Basic system (Item 810) offers similar capabilities without resistance measurement at a lower cost.

LISTED UNDER: Schematic Capture | Data Acquisition | Data Loggers

CableEye® HVX HiPot Cable Tester System: Base Unit Item 829

March 3, 2015 4:48 pm | CAMI Research, Inc. | Products

For diagnostic and Pass/Fail Testing — Permits expanded testing for insulation resistance and dielectric breakdown. After checking for opens, shorts, miswires, and resistance limits, the HVX hipot module will apply a user-selectable voltage from 10V to 1500V DC, or 10V to 1000V RMS AC, to each connection group in the cable. Ramp Up, Ramp Down, Dwell Time (same as Test Time), Trip Current, and Trip Delay (same as Soak Time) may be programmed for your specific requirements. Current leakage detected during the high voltage test phase provides a measure of insulation resistance up to 1 GΩ, and any leakage current exceeding a preset limit reveals the presence of moisture, flux, or other contamination on exposed contacts.

LISTED UNDER: Data Loggers | Meters | Probes

Control software offers high gains in speed and productivity

February 2, 2015 3:36 pm | by Cascade Microtech | Cascade Microtech | Product Releases | Comments

Cascade Microtech has evolved its probe station user environment to an unprecedented level of power and efficiency with the latest release of Velox. The company has consolidated its Nucleus and ProberBench system software packages into a universal ...

LISTED UNDER: Test Instrumentation | High Frequency | RF/Microwave
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Test probe cable assemblies designed for the inspection of high-frequency circuits

August 11, 2014 9:31 am | Product Releases | Comments

GradConn (Boca Raton, FL) has launched a new range of low-cost co-axial test probe cable assemblies for the inspection of high frequency circuits. Suitable for testing Hirose MS-156 and Murata MM8030 sub miniature coaxial switch connectors ...

LISTED UNDER: Test & Measurement | Probes | Test

Socket probe adapter designed to interface with 0.5mm pitch Fine pitch Ball Grid Array packages

April 30, 2014 3:23 pm | Ironwood Electronics, Inc. | Product Releases | Comments

Ironwood Electronics' (Eagan, MN) PB-BGA133A-Z-01 Socket Probe Adapter which allows high-speed testing of BGA device while accessing the signals using testers via header pins. Features of the PB-BGA133A-Z-01 include shortest possible trace length for maximum speed....

LISTED UNDER: Test

Anti-diffusion gold coating lessens or eliminates the need for probe cleaning

March 10, 2014 3:18 pm | Product Releases | Comments

Aries Electronics (Bristol, PA) announced the introduction of its unique Protect-A Probe, anti-diffusion, gold coating for its complete line of burn-in and test socket spring probes. The Protect-A Probe coating is designed to lessen or eliminate the need for probe cleaning....

LISTED UNDER: Test
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