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Test Instrumentation

JSB470 USB 24 Channel Parallel Digital IO Module

February 7, 2014 3:20 pm | J-Works, Inc. | Products

JSB470 series of digital input and output modules controlled over the USB. Engineers control the channel direction and values from any host computer. Each digital IO line is 5V tolerant and provides a minimum 2.5V output at 15ma, and sink 24ma. A technician wires the digital IO module to their hardware via a standard 25 pin sub "D" connector. The user communicates with the module from any programming or test language that supports USB communications as shown in provided sample applications. Perfect for a variety of control, monitor and test & measurement applications

LISTED UNDER: Data Acquisition | Industrial | Instrument Control

Software includes expanded electro-acoustic capability

October 4, 2013 12:29 pm | Audio Precision | Product Releases | Comments

Audio Precision announced a new software release that expands the features of the electro-acoustic test suite for APx audio analyzers. APx v3.4 adds Thiele/Small parameters, Complex Impedance and Loudspeaker Production Test to the APx platform.

LISTED UNDER: Test Instrumentation

Point tool automates test generation and unit test management

September 24, 2013 9:35 am | Ldra Technology, Inc | Product Releases | Comments

LDRA introduces LDRAunit, an integrated framework for automating the generation and management of unit tests. By separating unit testing capabilities from the rest of the LDRA tool suite, LDRA delivers a focused test management tool that addresses a need for software unit test without requiring investment in a complete tool chain.

LISTED UNDER: Test Instrumentation
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Test solution covers transmitter, receiver, dongle, and cable testing

July 22, 2013 12:50 pm | Tektronix | Product Releases | Comments

Tektronix announced availability of the industry’s only one-box solution for physical and protocol compliance testing for the latest Mobile High-Definition Link (MHL) Compliance Test Specification (CTS) 2.1 covering transmitter (Tx), receiver (Rx), dongle and cable testing for both physical (PHY) and protocol layers.

LISTED UNDER: Test Instrumentation

Embedded system access bundle designed for test support of complex projects

July 12, 2013 1:29 pm | Goepel Electronics Llc | Product Releases | Comments

GOEPEL electronic has complemented its range of Boundary Scan complete packages with a new option. SCANFLEX Designer Studio is a complete Boundary Scan test system incl. hardware, software, and a one-year maintenance contract offering an extremely reasonable price-performance-ratio.

LISTED UNDER: Test Instrumentation

Software library contains extensive DSP algorithms

June 26, 2013 4:05 pm | Data Translation, Inc. | Product Releases | Comments

Data Translation announced the release of the Signal Processing Library for .NET.  This hardware-independent software library contains extensive DSP algorithms that can be seamlessly integrated into many measurement applications, such as sound and vibration.

LISTED UNDER: Test Instrumentation

USB 3.0 test tools include a transmitter test solution for the SuperSpeedPlus 10 Gb/s specification

June 25, 2013 3:35 pm | Tektronix | Product Releases | Comments

Tektronix, Inc. announced a series of enhancements to its USB 3.0 test solutions including a transmitter test solution for the SuperSpeedPlus 10 Gb/s specification (option SSP). Other enhancements include a new USB 3.0 oscilloscope-based layered decode capability and an enhanced

LISTED UNDER: Test Instrumentation | Oscilloscopes

Optical modulation analyzer series includes new software option

March 13, 2013 4:03 pm | Tektronix | Product Releases | Comments

Tektronix announced a new software option for its OM4000 optical modulation analyzer series that offers automated test support for 400G multi-carrier coherent optical modulation. This software option will greatly reduce test times for researchers working on 400G and faster coherent optical systems....

LISTED UNDER: Test Instrumentation

Full electrical and conformance test support now available for test fixtures

December 12, 2012 10:26 am | Product Releases | Comments

Tektronix, Inc., announced that it is adding full electrical verification and conformance test support for JEDEC DDR4, DDR3L and LPDDR3 standards, giving design engineers the tools they need to bring chips and systems that incorporate these next generation memory technologies to market.

LISTED UNDER: Test Instrumentation
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