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The Tinker's Toolbox - A talk with Jodi Shelton of the Global Semiconductor Alliance

Tue, 06/21/2011 - 9:35am

alixHosted by Alix Paultre, the Tinker's Toolbox is the Advantage Design Group's web-based interview show where we talk about the latest technology, components, and design issues for the electronic design engineering community.

jodi sheltonIn this episode, we talk to Jodi Shelton of the Global Semiconductor Alliance on the fabless semiconductor industry and the group's view of where it is and where it is going. GSA's mission is to accelerate the growth and increase the return on invested capital of the global semiconductor industry by fostering a more effective ecosystem through collaboration, integration and innovation.

Here is another link to the podcast in case the play button is not visible: GSA Interview

Here is a recent press release from the group:

The Global Semiconductor Alliance (GSA), the voice of the global semiconductor industry, announces the appointment of Dan Hamling, Sr. Director, IC Test and Assembly Business Development, GE Global Electronics Services, to serve as the GSA Test Interest Group Chairman. Hamling was chosen for this position for his industry expertise, established credibility and immeasurable contribution to GSA’s past test-related efforts. Dan’s first action as chairman will be to establish a new mission, objectives and initiatives for the Test Interest Group.

“I am honored to have the world-class support of GSA and the expert knowledge of test industry leaders as we seek solutions to the challenges facing semiconductor test, both today and tomorrow,” commented Mr. Hamling.  “I am looking forward to working alongside these experts to produce meaningful results for the industry as we explore tough topics such as 3D IC test flows and test capacity management.”

Prior to joining GES, Mr. Hamling was founder and CEO of Chip Nexus, a provider of test capacity management software solutions. Before that, Mr. Hamling spent 12 years in sales and marketing at Teradyne, following eight years in test engineering and test engineering management roles at various semiconductor companies. Hamling has a B.S.E.E. from the University of Michigan, an M.S.E.E. from Stanford University and an MBA from the University of Texas.

“We are pleased that Dan Hamling will represent GSA’s interests in test, adding his vision to GSA’s,” said Jodi Shelton, President of GSA. “Dan’s experience and vast knowledge will make a great impact on our membership and the industry as a whole through the initiatives he will lead within the Test Interest Group.”

The first Test Interest Group meeting will be held on June 30 at 9:00am Pacific Time. An additional meeting time can also be scheduled for those in Asia if there is a reasonable number of persons interested in attending. GSA members and non-members in the semiconductor test arena are encouraged to join this meeting and voice their opinion on what major challenges should be addressed by the group. Those interested in joining should contact  Chelsea Boone, Director of Research, GSA.

For more information on GSA’s Test Interest Group, please visit http://www.gsaglobal.org/test/index.aspx.

     

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