Virtual Automated Test Summit 2009 – Applying the Top Trends in Automated Test

Mon, 04/19/2010 - 6:21am
National Instruments

The sixth annual Automated Test Summit featured NI and top industry experts who joined forces to discuss top trends influencing the automated test industry. Experts discussed software-defined instrumentation, which provides the flexibility needed to perform every test using a common instrumentation core while applying the different algorithms required by the software-defined devices under test. They also examined multicore and parallel processing technologies that give engineers the ability to generate, capture, analyze, and process the gigabytes of raw data required to properly design and test today's electronics products. In addition, the summit featured an entire workshop focused on developing automated test applications capable of achieving the highest possible throughput through parallel processing. A workshop was also devoted to RF and wireless test, which is among the fastest growing but also challenging electronic areas for engineers who need to learn wireless protocols and keep pace with the rapid introduction of new standards.

Now you can access this free content developed and presented by industry experts.

See all Virtual Automated Test Summits

Keynotes include:

Workshops include:

See all Virtual Automated Test Summits

The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.



Share this Story

You may login with either your assigned username or your e-mail address.
The password field is case sensitive.