Ron Demcko, AVX, www.avx.com
The goal is to supply the highest quality device in terms of reliability and performance parameters with considerations to size and weight.
A key to achieving these requirements is understanding dielectric and electrode losses within a technology and creating a new product from it. The design and development methods employed to obtain low loss, high reliable components for low power battery circuitry and large-scale power differ greatly.
In regards to low power battery circuitry, design efforts here actually have two main product goals.
Large value capacitors that can be utilized in parallel with batteries to provide peak power demand to the circuit load. In doing this, battery life between charges can be extended as well as the number of charge cycles increased. Common products in this area are double layer capacitors/supercapacitors or tantalum capacitors. In either material system solution the objective is to maximize the capacitance, minimize leakage current and ESR, and minimize the case size as much as possible. High reliability is obtained through ultra pure material systems, conservative design rules and tight process control.
Ultra low loss passives are the other main product goal. An example of low loss passive components in the RF world is that of high Q dielectrics that can be used in very efficient RF designs (thereby potentially reducing the number of stages used in a design). Another might be a high directivity low loss coupler used to measure output power and reduce power to optimize battery life. In both cases the development of high quality thin film dielectrics and metallization was required.
Two very relevant examples of low loss components developed and still evolving rapidly would be transient voltage suppressors made in a multilayer varistor (MLV) structure and Niobium Oxide capacitors. In both cases, a new component technology was created by the introduction of new material systems and manufacturing processes. MLVs have evolved into ultra low loss bi-directional voltage suppressors that act as EMI filters in their off state. More importantly, off state leakage can be driven into the sub nano amp region.
Niobium Oxide capacitors are an example of what a new material system might offer from a reliability point of view. This technology commonly offers a unique high resistance failure mode, which will still allow circuitry to function, even if a niobium oxide capacitor were inadvertently driven into failure.
In energy conversion and high power capacitors, reliability and performance concerns are exponentially magnified by the potential catastrophic consequences of a 3kv SMT capacitor shorting or as 940uf / 6kv capacitor blowing. Unique development efforts in both areas have eased designers concerns. The introduction of a conductive epoxy layer beneath the final tin termination on high voltage capacitors has resulted in the elimination of virtually all board flexure failures.
In the case of high voltage/high value power film capacitors research into internal fuse technology has created a high power capacitor that does not short – its failure mode is a gradual minimal drop in capacitance. Passive component reliability and performance are keeping up with the requirements in the fast paced design world. New material systems and processes are constantly being brought on line to address designer’s next generation needs.
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